Abstract: A method for processing an amine-based solvent contaminated by the introduction of sulfur oxides is provided. A potassium compound is introduced into a contaminated solvent, and the contaminated solvent is cooled so that a solubility of a potassium sulfate becomes less than a specified concentration of potassium sulfate. Further, an oxidizing agent is introduced into the contaminated solvent so that a potassium sulfite is oxidized to potassium sulfate. The potassium sulfate is filtered out, wherein a prepared solvent is formed. Further, a device for processing an amine-based, sulfur oxide-contaminated solvent is provided.

Abstract: A method for processing an amine-based solvent contaminated by the introduction of sulfur oxides is provided. A potassium compound is introduced into a contaminated solvent, and the contaminated solvent is cooled so that a solubility of a potassium sulfate becomes less than a specified concentration of potassium sulfate. Further, an oxidizing agent is introduced into the contaminated solvent so that a potassium sulfite is oxidized to potassium sulfate. The potassium sulfate is filtered out, wherein a prepared solvent is formed. Further, a device for processing an amine-based, sulfur oxide-contaminated solvent is provided.

Abstract: A method and an arrangement for optimizing the image quality of movable subjects imaged with a microscope system are proposed. The microscope system encompasses at least one objective that defines an image window. Motions of the subjects being observed are captured in the image frame. A computer system, having a means for determining a respective displacement vector field from a comparison of the respective pixels of two chronologically successive images, generates a trajectory from the synopsis of the displacement vector field of all the acquired images. A means for applying an operation to the image data along a trajectory is also provided.

Abstract: This invention comprises a method, a software, and a microscope system for monitoring and controlling information loss. The observation of information that is not present and the comparison of ideal loss to actual loss generates an explanatory component by means of a rule set. The user is instructed by the microscope system in an appropriate manner, for example by means of a display, to undertake actions that remove the defects.

Abstract: The method and the system simplify moving interactions by means of virtual reference subjects and flux-based coordinate transformations in order to generate a changeable frame of reference.

Abstract: A microscope system and a method that record spectra (60a, 61a, 62a, 63a, and 66a) of the dyes present in the specimen (15) using an SP module (20) are disclosed. A transformation of the data of the ascertained spectra, and of the dye spectra (60b, 61b, 62b, 63b, and 66b) stored in a database, is performed. The spectra are entered into a correspondingly into a divided transformation space. Allocation of the dye spectra (60b, 61b, 62b, 63b, and 66b) to the measured spectra (60a, 61a, 62a, 63a, and 66a) is accomplished by way of a comparison in the transformation space.

Abstract: A system and a method for setting a fluorescence spectrum measurement system for microscopy is disclosed. Using illuminating light (3) from at least one laser that emits light of one wavelength, a continuous wavelength region is generated. Dyes are stored, with the pertinent excitation and emission spectra, in a database of a computer system (23). For each dye present in the specimen (15), a band of the illuminating light (3) and a band of the detected light (17) are calculated, the excitation and emission spectra read out from the database being employed. Setting of the calculated band in the illuminating light and in the detected light is performed on the basis of the calculation. Lastly, data acquisition is accomplished with the spectral microscope (100).

Abstract: A method and a system for the analysis of co-localizations of dyes present in a specimen. The fluorescence spectra of the dyes present in the specimen are determined. A tolerance region around each of the fluorescence spectra is selected. The spectra of the specimen, in which at least two dyes are present, are then acquired pixel by pixel. Those spectra that lie within the tolerance region around the fluorescence spectra are then calculated. A lambda vector is calculated for each pixel and assigned to a spectrum. Images can be displayed in accordance with the assignment to the spectra.

Abstract: A method for separating fluorescence spectra of dyes present in a specimen (15) is disclosed. Firstly a spectral scan of the fluorescence spectrum of all the dyes present in the specimen (15) is performed. The fluorescence spectra associated with the respective dyes are stored in a database of the computer system. After spectral deconvolution of the acquired mixed fluorescence spectrum, a comparison is made between the measured individual spectra ascertained by spectral deconvolution and the fluorescence spectra associated with the respective dyes. Lastly, a linear deconvolution of the acquired mixed fluorescence spectrum is performed.

Abstract: A spectral scanning microscope and a method for data acquisition using a spectral scanning microscope are disclosed. A computer system is provided that encompasses a memory and a database. In combination with the computer system and/or the database, a continuous wavelength subregion that serves to illuminate the specimen can be selected from a continuous wavelength region using the spectral selection means. Also in combination with the computer system together with the spectral selection means, a detection band can be selected from the detected light beam.

Abstract: A method and an arrangement for automatic three-dimensional recording of structures of interest in a sample (15) are disclosed. The arrangement possesses a microscope having at least one microscope objective (13). The images of a sample (15) are acquired using a detector unit (19). A computer system (23) controls acquisition of the images and the microscope functions. The computer system (23) possesses a means (25) for automatically recording the entire marked specimen region in three dimensions.

Abstract: A method for user training for a scanning microscope makes possible rapid setting of a scanning microscope with little specimen impact. It is possible to acquire an entire spectrum of a specimen. This specimen can be retrieved from the memory of the computer system for training purposes. The user can then make changes in the setting capabilities displayed to him on the user interface and assess the result thereof, also on the user interface. This can be done without time pressure until the user is satisfied with the result displayed on the user interface.

Abstract: A microscope system includes at least one lens that defines an illumination field and at least one light source that emits an illuminating light beam for illuminating a specimen through the lens. At least one detector is provided for, pixel-by-pixel, detecting a detection light beam coming from the specimen. An electronic circuit is connected downstream from the detector, the electronic circuit including a memory unit for storing a wavelength-dependent brightness distribution of an illumination field of the at least one lens. The electronic circuit employs, pixel-by-pixel, the stored wavelength-dependent brightness distribution so as to form a homogeneously illuminated image field. An actuatable element is provided for controlling, pixel-by-pixel, an intensity of the illuminating light beam as a function of the stored wavelength-dependent brightness distribution so as to homogeneously illuminate the illumination field.

Abstract: A microscope system (4) for the observation of dynamic processes comprises a microscope (50) having at least one detector (19), and a computer (34). A buffer memory (54) precedes a comparator (58) that compares image contents of at least two successive image frames (56k and 56k+1). Depending on the result obtained from the comparator (58), the image frames are stored in different segments of a data structure (66) that is provided.

Abstract: The present invention concerns a method and an arrangement for imaging and measuring microscopic three-dimensional structures. In them, a data set is depicted in three-dimensional form on a display (27) associated with the microscope. At least one arbitrary section position and an arbitrary rotation angle are defined by the user. Rotation of the three-dimensional depiction on the display (27) is performed until a structure contained in the three-dimensional form reproduces on the display (27) a depiction that appears suitable to the user. The corresponding analytical operations are then performed on the structure.

Abstract: The present invention concerns a method, an arrangement, and a software program for controlling analytical and adjustment operations of a microscope. The arrangement has an electronic acquisition system (50) which converts the electrical signals coming from the detectors (19) into digital signals and preprocesses them. A PC (34) receives the digital signals from the electronic acquisition system (50) and identifies from the digital signals a graphical depiction. On a display (27), the graphical depiction is displayed and moreover the user is offered the opportunity to select adjustment functions. An input unit (33), with which selection of the adjustment functions and selection of at least one structure of interest can be achieved, is provided for selection. An electronic control system (67), with which the adjusting elements of the microscope can be controlled, is connected to the PC (34).

Abstract: The method implements time-optimized acquisition of special spectra using a scanning microscope, for which purpose the spectrum is subjected to bisecting interval measurements. The method for time-optimized acquisition of special spectra (emission spectra) using a scanning microscope is implemented in several steps. Firstly a complete spectrum to be examined, within which at least one special spectrum (emission spectrum) is located, is split into at least two intervals. The interval in which the intensity lies above a specific threshold is selected. That interval is split into at least two further intervals, and the procedure is continued until the size of the interval corresponds to the lower limit of the scanning microscope's measurement accuracy. The location of the special spectrum in the complete spectrum is defined, and an interval around it is created and is measured linearly.

Abstract: In an optical device (2), in particular a microscope, drift is sensed by the fact that a first image of an immovable specimen (30) is acquired at a first time (T(n-1)), and a second image thereof at a second time (T(n)). The drift is calculated from a comparison between the first and the second image.

Abstract: A method and a system for the analysis of co-localizations of dyes present in a specimen (15) are disclosed. For that purpose, the various fluorescence spectra of all dyes present in the specimen (15) are determined. A tolerance region around each of the fluorescence spectra is selected. The spectra of the specimen (15), in which at least two dyes are present, are then acquired pixel by pixel. Those spectra that lie within the tolerance region around the fluorescence spectra are then calculated. A lambda vector is calculated for each pixel and assigned to a spectrum. Images can be outputted on the display in accordance with the assignment to the spectra.

Abstract: A system and a method for setting a fluorescence spectrum measurement system for microscopy is disclosed. Using illuminating light (3) from at least one laser that emits light of one wavelength, a continuous wavelength region is generated. Dyes are stored, with the pertinent excitation and emission spectra, in a database of a computer system (23). For each dye present in the specimen (15), a band of the illuminating light (3) and a band of the detected light (17) are calculated, the excitation and emission spectra read out from the database being employed. Setting of the calculated band in the illuminating light and in the detected band [sic] is performed on the basis of the calculation. Lastly, data acquisition is accomplished with the spectral microscope (100).