Abstract: A content-addressable memory (CAM) has a memory array for storing data, the memory array having E entries each having N data bits and a valid bit. The functionality of the CAM is tested by testing the memory array for read/write functionality. The functionality of a matching function, a priority encoding function, a match flag function, and a multiple match flag function of the CAM is tested. The functionality of an invalidate data function and a valid data restricted search function is also tested.

Abstract: A reconfiguration memory device is provided associated with a main memory array. The reconfiguration memory device generates a spare address in real time corresponding to a faulty address. The reconfiguration memory device is coupled to an address line, so that when address information is received for the main memory array, the address information is also received by the reconfiguration memory device. The reconfiguration memory device is adapted to send an output signal that results in the address in the spare memory address array being addressed, if the received address information corresponds to a stored faulty address. The output signal includes a spare control signal that directs components to look to the output of the spare memory.

Abstract: A reconfiguration memory device is provided associated with a main memory array. The reconfiguration memory device generates a spare address in real time corresponding to a faulty address. The reconfiguration memory device is coupled to an address line, so that when address information is received for the main memory array, the address information is also received by the reconfiguration memory device. The reconfiguration memory device is adapted to send an output signal that results in the address in the spare memory address array being addressed, if the received address information corresponds to a stored faulty address. The output signal includes a spare control signal that directs components to look to the output of the spare memory.

Abstract: A method is provided for determining the location of faulty components in a computer memory array on a chip and for providing a software repair procedure. According to the method, the location of faulty components in a computer memory array is determined by successively reading and writing to locations in the array according to an algorithm. If a faulty component is detected, it is determined whether a spare component in a spare memory array on the chip is available. If a spare component is available, a spare component is designated to correspond to the faulty component. A look up table on the same chip stores information representing the location of the faulty component associated with information representing the location of the corresponding spare component.

Abstract: A memory device has first and second sets of memory cells. Each of the cells in the second set is a neighboring cell corresponding to a respective cell of the first set. A data generating function generates a first pattern and a second pattern. A controller causes the first pattern to be written in the first set of memory cells, causes each cell in the second set of memory cells to be read simultaneously while the corresponding neighboring cell in the first set of memory cells is being written to, and causes a datum to be read from each cell in the second set of memory cells after the corresponding neighboring cell in the first set of memory cells is written to. An output data evaluator determines whether the data read from the second set of memory cells match the second pattern, and detects a fault in the memory device, if the data read do not match the second pattern.

Abstract: Memory test hardware is provided for generating signals for testing a first memory array and a second memory array. The first memory array and the second memory array may be any two of main memory array, a spare memory array, and reconfiguration memory array, or the apparatus may be adapted for testing all three memory arrays. The memory test hardware may include a controller for generating control signals, a data generator coupled to the controller for generating data signals, and an address generator coupled to the controller for generating address signals. The test device may further include an output data evaluator and repair unit for receiving signals from the main memory array and the spare memory array and for detecting faults in those arrays.

Abstract: An optical probe is positioned between a pair of connectors positioned substantially adjacent to each other so as to read identifying markings on the face or surface of one of the connectors. The optical probe includes a probe head and an illumination device for projecting light substantially parallel to the face of one of the connectors, i.e., a surface being imaged. The illumination device includes a bifurcated fiber optic cable and a pair of prisms positioned so as to illuminate the surface being imaged from opposite directions. A spectral image representative of light scattered by laser etchings on the surface, or light reflected or absorbed by other markings on the surface is projected by a cylindrical mirror through the path of the light from the illumination device to a camera. The camera displays the image of the surface being imaged on a monitor. The probe head is substantially flat and thin so as to fit between the connectors without damaging the connectors.

Abstract: An apparatus for selective multi-directional illumination of an object, particularly for selective multi-directional imaging of an object, comprises a central mirror selectively rotatable about a central axis for reflecting light arriving along the central axis in selected directions radial to the axis. A plurality of differently tilted mirrors are mounted on an annular member selectively rotatable around the central axis for disposing selected ones of the tilted mirrors in the path of light from the central mirror. The tilted mirrors reflect light onto an object at a direction determined by the angular position of the central mirror and at an angle of elevation determined by the selected tilted mirror. Light reflected from the illuminated object reaches an imaging device along a path retracing the illuminating light whereby the direction of viewing of the imaged object corresponds to the direction of illumination of the object.

Abstract: Human inspection of an object (12) having a light-reflective areas (20) thereon arrayed in individual arrays (21) is enhanced by first capturing the image of selected portions of the arrays via one or more image capture devices (34). The images are processed to create a single image frame in which like portions of like arrays of light-reflective are uniformly spaced and oriented in a two-dimensional array having large scale regularity. The single image frame is then displayed on a display (48) for observation by a human operator (29). Because the displayed image frame of the light-reflective areas has large scale regularity, the operator bility to detect defects associated with missing or misaligned light-reflective areas will be enhanced.

Abstract: A bar code (14) on an object (12) is read a distance from the object by a television camera. The output signal of the camera is thresholded to obtain a binary signal indicative of the image information associated with at least one scan line. This binary signal is written into a FIFO storage device (28) at a rate corresponding to the rate at which the camera images the bar code. Once the binary signal is fully written into the FIFO storage device, the binary signal is read from the FIFO at a second, much slower rate for decoding by a bar code decoder (36). In this way, the image of the bar code can be obtained by a television camera which is capable of imaging the bar code at a distance, while the image information can be decoded by a bar code decoder that operates to perform decoding at a rate much slower than the rate at which the camera acquires information.

Abstract: A three-dimensional image of the surface (12) on an object (14) is obtained in real time by a system (10) which includes first and second reflective surfaces (32,38). The first reflective surface successively reflects a separate one of the first and second lines of light (26,28) onto the surface of the object so that each line of light strikes a first strip of area (34) at an acute angle. The second reflective surface reflects the field of view of a linescan camera (40) onto the object's surface so that the camera captures the image of a second strip of area (41) contiguous with the first strip. The first and second reflective surfaces are rapidly rotated in unison by one or more actuators (50,52) such that the object's surface is spanned by the camera each time the surface is spanned by a successive one of the first and second lines of light.

Abstract: Inspection of a circuit board (10) to detect missing and misaligned active and passive surface-mounted components (12) and (14), respectively, is accomplished by first illuminating the board with top light to enhance the image of the passive components. The circuit board is then displaced, relative to a linescan camera (28) trained on the board, so that the camera captures the image of successive strips of surface area running across the board perpendicular to its direction of movement. The images captured by the camera (28) are stored and thereafter processed by an image-processing system (33) to determine whether any passive component is missing or misaligned. The circuit board is then illuminated with side light to enhance the image of the active components. The circuit board is again displaced relative to the linescan camera so the camera captures the image of successive strips of surface area on the board.

Abstract: Inspection of a surface (14) on a circuit board (10) to detect for defects, such as misinserted leads (18--18) or missing or mis-sized components (20'--20'), is accomplished by directing beams of light (34--34) towards the surface along a first angular direction. The intensity of the light reflected along a second direction from each of a plurality of successive thin strips (40--40) running across the surface (14) is sensed by a linescan camera (36) which moves relative to the circuit board. The output signals produced by the linescan camera, as the linescan camera moves across the circuit board, are processed to obtain image data representative of each of the strips. Only the image data representative of predetermined regions (75--75) within each strip where defects may occur are retained. The retained image data are then analyzed to determine if defects are present.