Abstract: A spring loaded, high frequency, controlled impedance, coaxial probe assembly located within an insulated or conductive housing. A high frequency coaxial probe assembly consisting of a central contact which is fixed or axially floating within a controlled impedance connector body or assembly. A flexible, elastically de-formable, fixed or field replaceable and detachable, ground contact, snapped on and retained in place upon the controlled impedance connector body or assembly creating a fixed or axially floating reference plane or dimension from which the head of the probe contact will protrude through the controlled impedance connector body. The individual, high frequency, controlled impedance, coaxial probe assemblies are spring loaded to provide continuous axial signal contact, when deployed to a planar device such as a DUT (Device Under Test) board. The flexible, elastically de-formable, fixed or field replaceable and detachable, ground contact(s) provide a resilient and continuous wiping action.

Abstract: An interconnection system comprising two coaxial cables (20, 20′) connected together by matable connector halves (30a, 30b, 40a, 40b) is disclosed. A first half of the matable connector halves (30a, 30b, 40a, 40b) is a male connector half formed of a first insulating housing (40) in which is disposed at least one conductive pin (50) which is electrically connected to the center conductor (100) of one of the two coaxial cables (20, 20′). The conductive pin (50) is at least partly captivated by a first dielectric bead (60) within a first connector shield (55). The first connector shield (55) is electrically connected with the cable outer shield (110) of the same one of the two coaxial cables (20).

Abstract: A spring probe assembly 10 which contains spring probes 50 and 60 used for mating to various planar devices, such as a printed circuit board, via spring contact with interface areas on their surfaces. The assembly 10 is comprised of a non-metallic, insulating material block 20 which has been crafted to secure multiple, impedance matched, coaxial spring probe assemblies 50 and ground spring pins 60. A metallic clip 70 is used to join the signal probe shield 54 with the ground spring pin 62 in the appropriate geometry, while isolating that signal probe shield 54 and ground spring pin 62 from all other signal probe shields 54 and ground pins 62. The pins 52 of the signal probes 50 make contact with the surfaces of various planar devices via back pressure applied to the pins 52.