Patents by Inventor Frank Saurenbach

Frank Saurenbach has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Micro-electromechanical sensor device
    Publication number: 20080013102
    Abstract: A sensor device (100) comprises a holding body (10), at least one deflectable sensor element (20) fixed to the holding body (10), and a sensor array (30) with a plurality of sensitive layers (31) arranged on a surface (21) of the at least one sensor element (20), wherein each of the sensitive layers (31) is adapted to couple at least one probe substance to be sensed, wherein the at least one sensor element (20) has a spring constant below 5 N/m. Furthermore, a measuring device comprising the sensor device and a method of investigating a sample for sensing at least one probe molecule in the sample are described.
    Type: Application
    Filed: April 13, 2007
    Publication date: January 17, 2008
    Applicants: Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V., a corporation of Germany, Surface Imaging Systems Rastersonden- und Sensormesstechnik GmbH, a corporation of Germany, Ruprecht-Karls-Universitat Heidelberg, a corporation of Germany
    Inventors: Rudiger Berger, Mark Helm, Frank Saurenbach
  • Scanning force microscope with detector probe for the atomic resolution of a surface structure
    Patent number: 5715054
    Abstract: In a scanning probe microscope for the atomic resolution of the surface structure of an object wherein a detector probe is supported on a sensor head by a probe holder so as to be movable relative to the surface of an object to be scanned, the sensor head includes a first light conductor with an end face disposed opposite the detector probe and a second light conductor having an end face disposed opposite the object surface and an interferometer is connected to each light conductor for determining the distance between the first light conductor and the detector probe and, respectively, between the second light conductor and the object surface and an indicating instrument is provided which indicates the combined signal in such a way that the structure of said object surface is given independently of changes in distance between the sensor head and the object.
    Type: Grant
    Filed: June 24, 1996
    Date of Patent: February 3, 1998
    Assignee: Forschungzentrum Julich GmbH
    Inventors: Frank Saurenbach, Hans-Achim Fuss
  • Mounting arrangement for a probe tip of a scanning force or tunneling microscope
    Patent number: 5701381
    Abstract: In a support arrangement for a probe tip of a scanning force microscope or a SNOM wherein the movement of the probe tip while scanning a sample surface is interferometrically determined and wherein a ferrule mounted on a ferrule holder includes an optical light conductor with an end projecting from the ferrule and having an end face, the probe tip is supported by a mounting means which can be slipped onto the ferrule into a predetermined position in which the probe tip is disposed in front of the light conductor end face with a given gap therebetween.
    Type: Grant
    Filed: May 2, 1996
    Date of Patent: December 23, 1997
    Assignee: Forschungszentrum Julich GmbH
    Inventors: Frank Saurenbach, Hans-Achim Fuss