Abstract: A method for analyzing a microscopic sample with a microscope includes illuminating at least a sub-region of the microscopic sample by illumination light. Detection light emanating from the microscopic sample is guided on a detection beam path, which includes at least one focusing optical element and which has a plurality of detection beam path branches, each with at least one detector element. The detector elements are parts of the same surface detector. By art adjusting element in at least a first one of the detection beam path branches, an optical path length of the first detection beam path branch is adjusted in such a way that the portion of the detection light guided on the first detection beam path branch is focused on the detector element of the first detection beam path branch.

Abstract: A method for execution upon operation of a microscope or for depiction of an object, or a part thereof, imaged with the microscope includes depicting a proxy of the object on a display of the microscope or on a further display. At least one manipulation is performed on the proxy, or on the depiction of the proxy, using an input means. At least one depiction parameter for the depiction of the object or of the part of the object, or at least one microscope control parameter, is derived from the manipulation. The object or the part of the object is depicted in consideration of the derived depiction parameter or of the derived microscope control parameter.

Abstract: A method, in which a sample is manipulated with manipulation light, includes imaging the sample using a single plane illumination microscopy SPIM technique under illumination with illumination light being an illumination light sheet of fluorescent excitation light. Both the manipulation light and the illumination light are focused by an objective brought to an objective working position. Either the manipulation light or the illumination light are diverted after passing through the objective by use of a diverting device to propagate the manipulation light or the illumination light at an angle different from zero degrees with respect to an optical axis of the objective.

Abstract: A method for analyzing a microscopic sample with a microscope includes illuminating at least a sub-region of the microscopic sample by illumination light. Detection light emanating from the microscopic sample is guided on a detection beam path, which includes at least one focusing optical element and which has a plurality of detection beam path branches, each with at least one detector element. The detector elements are parts of the same surface detector. By art adjusting element in at least a first one of the detection beam path branches, an optical path length of the first detection beam path branch is adjusted in such a way that the portion of the detection light guided on the first detection beam path branch is focused on the detector element of the first detection beam path branch.

Abstract: A method for single plane illumination microscopy (SPIM) analysis of a sample includes simultaneously illuminating multiple sample layers by a single sheet of light. Detection light emanating from the individual sample layers is detected at different times and/or at different positions in a detection beam path. The detection beam path is branched using beam splitters and an effective refractive power of the individual beam splitters is zero.

Abstract: A microscope has a microscope control unit including at least one radio system having a wireless radio interface. The at least one radio system of the microscope control unit comprises: at least one first radio system configured to furnish at least one first radio characteristic and at least one second radio system configured to furnish at least one second radio characteristic, at least one radio system configured to furnish a first and a second radio characteristic in a predetermined time cycle, or both.

Abstract: An arrangement for use in illuminating a sample in SPIM microscopy includes an illumination objective configured to receive and focus a light strip or a quasi-light strip. The quasi-light strip is made up of a light bundle continuously moved back and forth in a light-strip plane. A deflection apparatus is configured to deflect the light strip or the quasi-light strip, after the light strip or the quasi-light strip has passed through the illumination objective, in such a way that the light strip or the quasi-light strip propagates at an angle different from zero degrees with respect to an optical axis of the illumination objective. The illumination objective and the deflection apparatus are arranged movably relative to one another.

Abstract: A method for scanning a sample using an electrically or electronically controllable microscope includes performing a continuous scanning of the sample so as to repeatedly generate a plurality of images of the sample, each of the plurality of images corresponding to a different time, the microscope being controlled via a control computer during the scanning. The plurality of images are analyzed using at least one second computer connected via a network, wherein the at least one second computer is configured to classify each of the plurality of images as one of interesting and non-interesting while the continuous scanning of the sample with the microscope continues. The continuous scanning of the sample is automatically influenced based on the classifying of the images performed by the at least one second computer.

Abstract: A method for scanning a sample using an electrically or electronically controllable microscope, includes scanning the sample so as to generate a plurality of images of the sample, each of the plurality of images corresponding to at least one of a different region of the sample and a different time. The microscope is controlled via a control computer during the scanning. The plurality of images are analyzed using at least one second computer connected via a network. The plurality of images are classified and/or the scanning is influenced based on the analyzing.

Abstract: The invention relates to a method for tomographic investigation of a sample (9), in which method a sample (9) is illuminated with an illuminating light bundle (3) and in which a transmitted light bundle (10) that contains the light of the illuminating light bundle (3) transmitted through the sample (9) is detected with a transmission detector (13). The invention further relates to an apparatus for tomographic investigation of a sample (9). Provision is made that the illuminating light bundle (3) and the transmitted light bundle (10) pass in opposite propagation directions through the same objective (7).

Abstract: The invention relates to a method for microscopic investigation of a plurality of samples.

Abstract: The invention relates to a method in which a sample is manipulated with manipulation light, and in which the sample is imaged by means of the SPIM technique under illumination with illumination light, in particular excitation light for fluorescence excitation, in the form of an illumination light sheet. The method is notable for the fact that both the manipulation light and the illumination light are focused by the same objective that is arranged in an objective working position, or by different objectives that are brought successively into an objective working position; and that the manipulation light and/or the illumination light, after passing through the objective, is diverted by means of a diverting device in such a way that it propagates at an angle different from zero degrees with respect to the optical axis of the objective.

Abstract: A laser microdissection method includes capturing an electronic image of an image detail of a specimen. The image detail is processed using, image analysis so as to automatically ascertain an object to be cut out. A nominal cutting line around the object to be cut out is automatically defined. Subsequently, the object is cut out in response to a relative motion between a laser beam and the specimen.

Abstract: A microscope for investigating a microscopic sample is disclosed, the microscope comprising a receiving apparatus that furnishes primary signals which contain at least one information item regarding at least one property of the sample, and the microscope comprising an output apparatus that generates, from the primary signals, secondary signals perceptible by the user. Provision is made that the output apparatus furnishes secondary signals perceptible auditorily and/or perceptible olfactorily and/or perceptible gustatorily and/or perceptible tactilely and/or perceptible by thermoreception; and/or that the microscope comprises a feedback apparatus with which the user can control the receiving apparatus in real time during the sensing of information regarding at least one property of the sample.

Abstract: A method for illuminating at least one sample in SPIM microscopy includes generating a light beam and forming a light strip from the light beam using an optical device that interacts with the light beam. The light strip is passed strip through at least one objective having optics configured to deliver detection light emanating from the sample directly or indirectly to a detector, with the objective optics interacting with the light strip. The light strip is deflected using a light-redirecting device downstream of the objective optics so as to propagate the light strip, after deflection, at an angle other than zero degrees with respect to an optical axis of the objective in order to illuminate the sample.

Abstract: A method for execution upon operation of a microscope or for depiction of an object, or a part thereof, imaged with the microscope includes depicting a proxy of the object on a display of the microscope or on a further display. At least one manipulation is performed on the proxy, or on the depiction of the proxy, using an input means. At least one depiction parameter for the depiction of the object or of the part of the object, or at least one microscope control parameter, is derived from the manipulation. The object or the part of the object is depicted in consideration of the derived depiction parameter or of the derived microscope control parameter.

Abstract: A microscope has a microscope control unit including at least one radio system having a wireless radio interface. The at least one radio system of the microscope control unit comprises: at least one first radio system configured to furnish at least one first radio characteristic and at least one second radio system configured to furnish at least one second radio characteristic, at least one radio system configured to furnish a first and a second radio characteristic in a predetermined time cycle, or both.

Abstract: An arrangement for use in illuminating a sample in SPIM microscopy includes an illumination objective configured to receive and focus a light strip or a quasi-light strip. The quasi-light strip is made up of a light bundle continuously moved back and forth in a light-strip plane. A deflection apparatus is configured to deflect the light strip or the quasi-light strip, after the light strip or the quasi-light strip has passed through the illumination objective, in such a way that the light strip or the quasi-light strip propagates at an angle different from zero degrees with respect to an optical axis of the illumination objective. The illumination objective and the deflection apparatus are arranged movably relative to one another.

Abstract: An immersion objective for microscopic investigation of a specimen is provided wherein an outer lens is disposed in an objective body. A delivery device including a cap that is disposed over the objective body so as to form a space adapted to receive an immersion liquid is also provided. The cap is open in a region of the outer lens so as to form a gap with the outer lens. The cap includes at least one connector configured to provide a continuous supply of the immersion liquid to the space so that the immersion liquid emerges through the gap to a region between the outer lens and at least one of the specimen and a specimen slide.

Abstract: An arrangement and method are provided for determining the distance between an objective of a microscope and a sample examined with the microscope. Fitted on the objective or in the immediate vicinity of the objective is a capacitive sensor in whose measuring range the sample and/or a microscope slide supporting the sample is located or into which it can be brought. The sample and/or the slide causing a measurable change in the capacitance of the sensor. From the change in the capacitance of the sensor, the distance of the sample and/or of the microscope slide from the sensor is determined, and thus the distance of the sample from the objective. A capacitive distance sensor can be applied in such an arrangement by which a stray field can be generated between at least two electrodes. The capacitance experiences a measurable change owing to an object introduced into the stray field. The electrodes of the sensor are arranged as substantially coaxial lateral surfaces.