Patents by Inventor Frank Thys

Frank Thys has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10267629
    Abstract: The present invention provides a dimensional measurement probe unit (100) for attachment to a probe head (200) of a localizer (300), comprising: a measurement probe (150) for dimensional measurement of an object (400); a revolute joint (170) integrated into the measurement probe (150); and a probe unit interface (120) for repeated dismountable connection to a probe head (200) wherein the probe unit interface (120) is revolutely connected to the measurement probe (150) by the revolute joint (170).
    Type: Grant
    Filed: April 8, 2015
    Date of Patent: April 23, 2019
    Assignee: NIKON METROLOGY NV
    Inventors: Frank Thys, Hans Thielemans, Raf Nysen, Laurens Van Horenbeek
  • Publication number: 20180172442
    Abstract: The present invention provides a dimensional measurement probe unit (100) for attachment to a probe head (200) of a localizer (300), comprising: a measurement probe (150) for dimensional measurement of an object (400); a revolute joint (170) integrated into the measurement probe (150); and a probe unit interface (120) for repeated dismountable connection to a probe head (200) wherein the probe unit interface (120) is revolutely connected to the measurement probe (150) by the revolute joint (170).
    Type: Application
    Filed: April 8, 2015
    Publication date: June 21, 2018
    Applicant: NIKON METROLOGY NV
    Inventor: Frank Thys
  • Patent number: 9696146
    Abstract: The present invention relates to a scanning probe (100) for the dimensional acquisition of an object (400) by irradiating the object (400) with light and detecting reflected light comprising: a detection unit (120) comprising an imaging sensor (122) and a sensor lens assembly (124) for detecting the reflected light, a light projecting unit (141) comprising a light source (142) for generating light, and source optics (145) for focusing the light, and light plane generating optics (143) for generating a light plane (149) for irradiating the object, and an adjustment mechanism (155) comprised in the light projecting unit (141), for adjusting the position or orientation of the light plane relative to the detection unit. It further relates to a method for assembly of a scanning probe (100).
    Type: Grant
    Filed: March 28, 2013
    Date of Patent: July 4, 2017
    Assignee: NIKON METROLOGY NV
    Inventors: Patrick Blanckaert, Frank Thys, Raf Nysen, Geert Vandenhoudt
  • Publication number: 20150043008
    Abstract: The present invention relates to a scanning probe (100) for the dimensional acquisition of an object (400) by irradiating the object (400) with light and detecting reflected light comprising: a detection unit (120) comprising an imaging sensor (122) and a sensor lens assembly (124) for detecting the reflected light, a light projecting unit (141) comprising a light source (142) for generating light, and source optics (145) for focusing the light, and light plane generating optics (143) for generating a light plane (149) for irradiating the object, and an adjustment mechanism (155) comprised in the light projecting unit (141), for adjusting the position or orientation of the light plane relative to the detection unit. It further relates to a method for assembly of a scanning probe (100).
    Type: Application
    Filed: March 28, 2013
    Publication date: February 12, 2015
    Inventors: Patrick Blanckaert, Frank Thys, Raf Nysen, Geert Vandenhoudt
  • Patent number: 7428061
    Abstract: An optical probe for measuring features of an object comprises two or more viewing directions and two or more projection directions. A method of measuring the features of an object comprises configuring an optical probe into two or more optical groups, wherein an optical group comprises one or more viewing directions and one or more projection directions, wherein at least one viewing direction and at least one projection direction is different between the optical groups, and wherein data obtained by the viewing directions is generated only from patterns projected by the projection directions of the same optical group. The method further comprises collecting data from each optical group while scanning the object.
    Type: Grant
    Filed: January 6, 2006
    Date of Patent: September 23, 2008
    Assignee: Metris IPR N.V.
    Inventors: Bart Van Coppenolle, Lieven De Jonge, Kris Vallons, Frank Thys
  • Publication number: 20060215176
    Abstract: An optical probe for measuring features of an object comprises two or more viewing directions and two or more projection directions. A method of measuring the features of an object comprises configuring an optical probe into two or more optical groups, wherein an optical group comprises one or more viewing directions and one or more projection directions, wherein at least one viewing direction and at least one projection direction is different between the optical groups, and wherein data obtained by the viewing directions is generated only from patterns projected by the projection directions of the same optical group. The method further comprises collecting data from each optical group while scanning the object.
    Type: Application
    Filed: January 6, 2006
    Publication date: September 28, 2006
    Inventors: Bart Van Coppenolle, Lieven De Jonge, Kris Vallons, Frank Thys
  • Patent number: 7009717
    Abstract: An optical probe for measuring features of an object comprises two or more viewing directions and two or more projection directions. A method of measuring the features of an object comprises configuring an optical probe into two or more optical groups, wherein an optical group comprises one or more viewing directions and one or more projection directions, wherein at least one viewing direction and at least one projection direction is different between the optical groups, and wherein data obtained by the viewing directions is generated only from patterns projected by the projection directions of the same optical group. The method further comprises collecting data from each optical group while scanning the object.
    Type: Grant
    Filed: August 13, 2003
    Date of Patent: March 7, 2006
    Assignee: Metris N.V.
    Inventors: Bart Van Coppenolle, Lieven De Jonge, Kris Vallons, Frank Thys
  • Publication number: 20040130729
    Abstract: An optical probe for measuring features of an object comprises two or more viewing directions and two or more projection directions. A method of measuring the features of an object comprises configuring an optical probe into two or more optical groups, wherein an optical group comprises one or more viewing directions and one or more projection directions, wherein at least one viewing direction and at least one projection direction is different between the optical groups, and wherein data obtained by the viewing directions is generated only from patterns projected by the projection directions of the same optical group. The method further comprises collecting data from each optical group while scanning the object.
    Type: Application
    Filed: August 13, 2003
    Publication date: July 8, 2004
    Inventors: Bart Van Coppenolle, Lieven De Jonge, Kris Vallons, Frank Thys
  • Patent number: 5654290
    Abstract: Drug compositions comprised of therapeutically effective amounts of at least one compound selected from the group consisting of:DHA esterified in the form of lysophosphatidyl-choline (lyso-PCDHA) in position sn-2;DHA-phosphatidylcholines (PCDHAs) in which DHA is esterified in position sn-2 and which have an acyl group of [very short length] 2 to 6 carbon atoms in position sn-1;and triglycerides in which DHA is esterified in position sn-2 and which have acyl groups of [very short length] 2 to 6 carbon atoms in positions sn-1 and sn-3.
    Type: Grant
    Filed: September 21, 1994
    Date of Patent: August 5, 1997
    Assignees: Institut National de la Sante et de la Recherche Medicale, Imedex
    Inventors: Yves Bayon, Martine Croset, Michel Lagarde, Jean Lecerf, Frank Thies, Jean-Louis Tayot, Veronique Chirouze