Patents by Inventor Frank Wendzinski

Frank Wendzinski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for the quality control of material layers
    Patent number: 6943902
    Abstract: Disclosed is a method for quality control of a material layer, which involves providing the material of the layer with an agent for absorbing an electromagnetic radiation, irradiating the surface of the layer with an electromagnetic radiation, and measuring the amount of light emitted by the material layer, for example, reflected radiation or fluorescence radiation.
    Type: Grant
    Filed: December 1, 2000
    Date of Patent: September 13, 2005
    Assignee: Institut Für Chemo-Und Biosensorik Münster E.V.
    Inventors: Michael Borchardt, Frank Wendzinski, Dorthe Eikermann
  • Method for the quality control of material layers
    Publication number: 20020180992
    Abstract: The invention relates to a method for the quality control of material layers (7), whereby the surface of the layer is irradiated with electromagnetic radiation (8) and the amount of light (9) emitted by the material layer by, for example, reflected radiation or fluorescent radiation is determined, the material of the layer having been provided with an agent for absorbing the radiation.
    Type: Application
    Filed: June 6, 2002
    Publication date: December 5, 2002
    Inventors: Michael Borchardt, Frank Wendzinski, Dorthe Eikermann