Patents by Inventor Franklin Stampley WALDEN, II

Franklin Stampley WALDEN, II has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for safe control of gas delivery to an electron microscope sample holder
    Patent number: 9915926
    Abstract: System and method for safely controlling the containment of gas within a manifold system and the delivery of gas to a sample holder for an electron microscope for imaging and analysis.
    Type: Grant
    Filed: August 3, 2015
    Date of Patent: March 13, 2018
    Assignee: Protochips, Inc.
    Inventors: Daniel S. Gardiner, John Damiano, Jr., David P. Nackashi, William Bradford Carpenter, James Rivenbark, Mark Uebel, Michael Zapata, III, Rebecca Thomas, Franklin Stampley Walden, II
  • METHOD FOR MONITORING ENVIRONMENTAL STATES OF A MICROSCOPE SAMPLE WITH AN ELECTRON MICROSCOPE SAMPLE HOLDER
    Publication number: 20180068827
    Abstract: An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.
    Type: Application
    Filed: November 14, 2017
    Publication date: March 8, 2018
    Inventors: Daniel Stephen Gardiner, William Bradford Carpenter, John Damiano, JR., Franklin Stampley Walden, II, David P. Nackashi
  • Device for monitoring environmental states of a microscope sample with an electron microscope sample holder
    Patent number: 9818578
    Abstract: An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.
    Type: Grant
    Filed: February 19, 2015
    Date of Patent: November 14, 2017
    Assignee: Protochips, Inc.
    Inventors: Daniel Stephen Gardiner, William Bradford Carpenter, John Damiano, Jr., Franklin Stampley Walden, II, David P. Nackashi
  • METHOD FOR OPTIMIZING FLUID FLOW ACROSS A SAMPLE WITHIN AN ELECTRON MICROSCOPE SAMPLE HOLDER
    Publication number: 20170098526
    Abstract: A support for an electron microscope sample includes a body defining a void for receiving a first micro-electronic device, and a first gasket positioned about the first surface. The first gasket further defines an arm extending at an angle away from a horizontal extending through the first micro-electronic device. In operation, the first micro-electronic device is installed onto the first gasket and the arm engages an outer facing side of the first micro-electronic device to grip the first micro-electronic device.
    Type: Application
    Filed: November 23, 2016
    Publication date: April 6, 2017
    Inventors: Daniel Stephen Gardiner, Franklin Stampley Walden, II, John Damiano, Jr.
  • MEMS FRAME HEATING PLATFORM FOR ELECTRON IMAGABLE FLUID RESERVOIRS OR LARGER CONDUCTIVE SAMPLES
    Publication number: 20170062177
    Abstract: A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.
    Type: Application
    Filed: August 31, 2016
    Publication date: March 2, 2017
    Inventors: Franklin Stampley Walden II, John Damiano, JR., Daniel Stephen Gardiner, David P. Nackashi, William Bradford Carpenter
  • METHOD FOR FORMING AN ELECTRICAL CONNECTION TO A SAMPLE SUPPORT IN AN ELECTRON MICROSCOPE HOLDER
    Publication number: 20170054239
    Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
    Type: Application
    Filed: September 1, 2016
    Publication date: February 23, 2017
    Inventors: John DAMIANO, JR., David P. NACKASHI, Daniel Stephen Gardiner, Franklin Stampley WALDEN, II, William Bradford CARPENTER
  • METHOD FOR ENABLING MODULAR PART REPLACEMENT WITHIN AN ELECTRON MICROSCOPE SAMPLE HOLDER
    Publication number: 20160336144
    Abstract: An electron microscope sample holder that includes at least one capillary having a sufficient inner diameter to act as a catheter pathway that allows objects that can be accommodated within the at least one capillary to be replaced or swapped with other objects. The sample holder having at least one capillary allows the user to insert and remove temporary fluidic pathways, sensors or other tools without the need to dissemble the holder.
    Type: Application
    Filed: May 13, 2016
    Publication date: November 17, 2016
    Inventors: Daniel Stephen Gardiner, Franklin Stampley Walden, II, John Damiano, JR.
  • Method for optimizing fluid flow across a sample within an electron microscope sample holder
    Patent number: 9466459
    Abstract: A flow directing gasket for improving the flow of a gas or liquid across electron beam transparent membranes in environmental cells within a sample holder of an electron microscope, and uses of the sample holders comprising said flow directing gaskets.
    Type: Grant
    Filed: June 3, 2015
    Date of Patent: October 11, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: Daniel Stephen Gardiner, Franklin Stampley Walden, II, John Damiano, Jr.
  • Method for forming an electrical connection to an sample support in an electron microscope holder
    Patent number: 9437393
    Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
    Type: Grant
    Filed: November 13, 2013
    Date of Patent: September 6, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Franklin Stampley Walden, II, William Bradford Carpenter
  • METHOD FOR SAFE CONTROL OF GAS DELIVERY TO AN ELECTRON MICROSCOPE SAMPLE HOLDER
    Publication number: 20160033355
    Abstract: System and method for safely controlling the containment of gas within a manifold system and the delivery of gas to a sample holder for an electron microscope for imaging and analysis.
    Type: Application
    Filed: August 3, 2015
    Publication date: February 4, 2016
    Inventors: Daniel S. Gardiner, John Damiano, JR., David P. Nackashi, William Bradford Carpenter, James Rivenbark, Mark Uebel, Michael Zapata, III, Rebecca Thomas, Franklin Stampley Walden, II
  • METHOD FOR OPTIMIZING FLUID FLOW ACROSS A SAMPLE WITHIN AN ELECTRON MICROSCOPE SAMPLE HOLDER
    Publication number: 20150348745
    Abstract: A flow directing gasket for improving the flow of a gas or liquid across electron beam transparent membranes in environmental cells within a sample holder of an electron microscope, and uses of the sample holders comprising said flow directing gaskets.
    Type: Application
    Filed: June 3, 2015
    Publication date: December 3, 2015
    Inventors: Daniel Stephen Gardiner, Franklin Stampley Walden, II, John Damiano, JR.
  • METHOD FOR MONITORING ENVIRONMENTAL STATES OF A MICROSCOPE SAMPLE WITH AN ELECTRON MICROSCOPE SAMPLE HOLDER
    Publication number: 20150235805
    Abstract: An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.
    Type: Application
    Filed: February 19, 2015
    Publication date: August 20, 2015
    Inventors: Daniel Stephen Gardiner, William Bradford Carpenter, John Damiano, Jr., Franklin Stampley Walden, II, David P. Nackashi
  • DEVICE FOR IMAGING ELECTRON MICROSCOPE ENVIRONMENTAL SAMPLE SUPPORTS IN A MICROFLUIDIC OR ELECTROCHEMICAL CHAMBER WITH AN OPTICAL MICROSCOPE
    Publication number: 20140268321
    Abstract: A sample holder for optical microscopy that incorporates sample holders typically used in electron microscopy to maximize the correlation between optical and electron microscopy images and data.
    Type: Application
    Filed: March 13, 2014
    Publication date: September 18, 2014
    Applicant: PROTOCHIPS, INC.
    Inventors: John DAMIANO, JR., David NACKASHI, Daniel Stephen GARDINER, Franklin Stampley WALDEN, II, William Bradford CARPENTER, Madeline DUKES, Steven BUDD
  • METHOD FOR FORMING AN ELECTRICAL CONNECTION TO AN SAMPLE SUPPORT IN AN ELECTRON MICROSCOPE HOLDER
    Publication number: 20140138558
    Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
    Type: Application
    Filed: November 13, 2013
    Publication date: May 22, 2014
    Applicant: PROTOCHIPS, INC.
    Inventors: John DAMIANO, JR., David P. NACKASHI, Daniel Stephen GARDINER, Franklin Stampley WALDEN, II, William Bradford CARPENTER
  • Tip of a sample holder
    Patent number: D806892
    Type: Grant
    Filed: June 18, 2014
    Date of Patent: January 2, 2018
    Assignee: Protochips, Inc.
    Inventors: Franklin Stampley Walden, II, Daniel Stephen Gardiner, John Damiano, Jr., David P. Nackashi