Abstract: In a method for determining a thickness of a layer of electromagnetically conductive material, the measurement errors resulting from different quality of the basic material are eliminated. For each basic material, one dimensionless characteristic value (K) is ascertained. With the aid of a characteristic calibration curve, each characteristic value (K) can be assigned a correction factor (F), with which the measured value of the layer thickness (DM) can be converted into a real value of the layer thickness (D). Different electrical and magnetic properties, dictated by the different quality of the basic material, can thus be largely eliminated.

Abstract: A process for determining a thickness of a layer of electrically conductive material, any measurement errors are converted into dimensionless norm values with the aid of a normalization process. In this conversion, measurement errors, for example due to temperature drift and different electrical and magnetic properties of the base material of the carrying body can be largely eliminated. These norm values are converted into layer thickness values with the aid of a calibration curve.