Patents by Inventor Franz-Erich Wolter

Franz-Erich Wolter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20090169050
    Abstract: A method for characterization of objects has the steps of: a) describing an object with an elliptical self-adjoint eigenvalue problem in order to form an isometrically invariant model; b) determining eigenvalues of the eigenvalue problem; and c) characterizing the object by the eigenvalues.
    Type: Application
    Filed: May 18, 2006
    Publication date: July 2, 2009
    Applicant: UNIVERSITÄT HANNOVER
    Inventors: Franz-Erich Wolter, Martin Reuter, Niklas Peinecke
  • Patent number: 6956568
    Abstract: Umbilics of two surfaces are compared and it is determined from this comparison whether the suspect surface is a copy of the original surface based on the comparison. Comparing umbilics includes determining whether locations of the umbilics of the suspect surface match within a specified margin umbilics of the original surface, and determining whether pattern types of umbilics of the suspect surface match pattern types of corresponding umbilics of the original surface. A “weak” test may be performed, in which corresponding points on the two surfaces are compared, wherein the comparison of umbilics is performed if corresponding points of the two surfaces are located within a specified margin of each other. The points may be gridpoints on wireframes, which in turn may be based on lines of curvature of the surfaces. Comparing umbilics is performed if it is determined that each surface has at least one umbilic.
    Type: Grant
    Filed: January 9, 2002
    Date of Patent: October 18, 2005
    Assignee: Massachussetts Institute of Technology
    Inventors: Takashi Maekawa, Nicholas M. Patrikalakis, Franz-Erich Wolter, Hiroshi Masuda
  • Publication number: 20030128209
    Abstract: Umbilics of two surfaces are compared and it is determined from this comparison whether the suspect surface is a copy of the original surface based on the comparison. Comparing umbilics includes determining whether locations of the umbilics of the suspect surface match within a specified margin umbilics of the original surface, and determining whether pattern types of umbilics of the suspect surface match pattern types of corresponding umbilics of the original surface. A “weak” test may be performed, in which corresponding points on the two surfaces are compared, wherein the comparison of umbilics is performed if corresponding points of the two surfaces are located within a specified margin of each other. The points may be gridpoints on wireframes, which in turn may be based on lines of curvature of the surfaces. Comparing umbilics is performed if it is determined that each surface has at least one umbilic.
    Type: Application
    Filed: January 9, 2002
    Publication date: July 10, 2003
    Applicant: Massachusetts Institute of Technology
    Inventors: Takashi Maekawa, Nicholas M. Patrikalakis, Franz-Erich Wolter, Hiroshi Masuda