Abstract: A separator plate for an electrochemical system, an electrolyzer, a bipolar plate comprising such a separator plate, an electrolyzer comprising such a separator plate, and to tooling for producing such a separator plate. The separator plate comprising a flow area having a plurality of integrally formed support structures. An outer contour of the support structures in each case comprises: a first circular arc-shaped portion and a second circular arc-shaped portion, wherein a circular arc center point of the first circular arc-shaped portion and a circular arc center point of the second circular arc-shaped portion are arranged at a distance from each other on a longitudinal axis of the respective sup-port structure, and a joining portion which joins together the first circular arc-shaped portion and the second circular arc-shaped portion, wherein a width of the joining portion is smaller than a diameter of the first and/or second circular arc-shaped portion.

Abstract: A multi-channel recording device for recording the time profiles of a plurality of measurement signals which can be connected to the device. The device has first and second groups of optical indicators on the front of the device and scale strips corresponding to the physical variables to be measured. There are n indicators in the first group, m indicators in the second group and scale strips where n is greater than m. The device assigns one and only one of the m indicators to each of the n indicators.

Abstract: Point defects or impurities, which are detrimental to the quality of elecnic components, can be eliminated by means of rearsurface damage, which induces dislocations and/or stacking faults, by means of mechanical stress to the semiconductor wafers used in the manufacture of those components. For this purpose, the semiconductor wafers are brought into contact, before polishing, oxidation and thermal treatment, with moving carrier bodies covered with an elastic carrier medium having abrasive grain bonded to it, which creates the desired mechanical stress by forming a large number of very fine scratches and fissures in the surface of the semiconductor wafers.

Abstract: For the manufacture of semiconductor wafers with a rear side having a geting action in subsequent oxidation processes by means of the action of light, especially laser, radiation ("laser damage"), there are advantageously chosen wafers with a fine surface structure that contains faces that are inclined by at least 15.degree. in the actual profile by comparison with the geometrically ideal profile of the surface according to known standards. As a result, in comparison to smooth surfaces, considerable savings in energy and time are achieved.

Abstract: A method for producing contrast rich, permanent and slag-free characterizations, particularly on polished semiconductor disks is described, in which the surface for generating the surface pattern is partially melted by laser radiation. According to the invention, a surface segment corresponding to 1.5 to 6.5 times the surface area of the desired surface pattern is irradiated, and the semiconductor material is caused to melt and partially vaporize only in the center thereof.

Abstract: A method for converting digital chrominance signals of a cartesian color coordinate system into digital color signals and saturation signals of a polar color coordinate system and including a transformation circuit for the transformation from cartesian to polar coordinates.

Abstract: The invention relates to a method and to a circuit arrangement for the partial recorrection of color recognition spaces in color recognition. Before the color recognition, the color coordinates (color locations) of characteristic sample points are determined in the colors to be recognized and sample color numbers are allocated to them, said sample color numbers being deposited in a color recognition memory. All color numbers of the remaining color locations of the color space are determined from the sample color numbers and are likewise stored. The respective color locations or, respectively, memory locations occupied with the same color numbers form a color recognition space within the color space. For subsequent boundary correction of a color recognition space, at least one auxiliary color sample is taken from a color to be recognized in the area of the desired change and the necessary sample color number is allocated to it.

Abstract: An apparatus and a method for the recognition of colors on a colored image illuminated with a light source of a known spectrum composition, wherein the intensities of three primary colors are measured opto-electronically as color components, which represent the spatial co-ordinates of the color locations in a color space. Prior to color recognition the color components of at least one characteristic test point in each color or color region, which is to be recognized, are measured and noted. The test color components represent the corresponding test color locations in the color space. An identification symbol is assigned to each color component triplet of the test points and noted too.

Abstract: In the crucible-pulling of crystalline rods by the Czochralski technique, pulling plants that operate with a radiation screen offer a number of advantages. This process is optimized according to the invention by the use of a radiation screen which is joined to a lifting and pivoting mechanism that can be operated throughout the entire pulling process, and which is brought into position above the melt only when the contents of the crucible have been melted.

Abstract: An etching agent for III/V semiconductor material consisting of(a) 1 to 30 percent by weight of hydrofluoric acid,(b) 2 to 30 percent by weight of hydrogen peroxide,(c) 1 to 75 percent by weight of sulfuric acid,(d) 15 to 95 percent by weight of water,Wherein the quantities by weight of the individual components are so chosen that they will add up to 100 percent by weight.