Patents by Inventor Fred C. Session

Fred C. Session has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Double layer metal (DLM) power MOSFET
    Patent number: 8502313
    Abstract: This document discusses, among other things, a semiconductor device including a first metal layer coupled to a source region and a second metal layer coupled to a gate structure, wherein at least a portion of the first and second metal layers overlap vertically.
    Type: Grant
    Filed: April 21, 2011
    Date of Patent: August 6, 2013
    Assignee: Fairchild Semiconductor Corporation
    Inventors: Rohit Dikshit, Mark L. Rinehimer, Michael D. Gruenhagen, Joseph A. Yedinak, Tracie Petersen, Ritu Sodhi, Dan Kinzer, Christopher L. Rexer, Fred C. Session
  • Temperature measurement using ion implanted wafers
    Patent number: 5435646
    Abstract: The value of an unknown test temperature is measured by heating a test wafer (58) to the unknown temperature, measuring the surface electrical resistivity of the test wafer (58), and determining the value of the unknown temperature from the measured surface electrical resistivity. The test wafer (58) is prepared by providing an initial wafer (50), first ion implanting the initial wafer (50) with a first dose of an ionic species, and annealing the ion implanted initial wafer (50) at an annealing temperature. The preparation is completed by second ion implanting the annealed wafer with a second dose of the same ionic species as used in the first dose to form a test wafer, the second dose being lower than the first dose.
    Type: Grant
    Filed: November 9, 1993
    Date of Patent: July 25, 1995
    Assignee: Hughes Aircraft Company
    Inventors: Warren F. McArthur, Fred C. Session