Abstract: A method for generating a circuit description for a multi-die field-programmable gate array, FPGA, comprising a first FPGA die and at least one further FPGA die is described. The method is performed in an FPGA design tool and comprises automatically evaluating a first and a second partition of a partitioned circuit description, the partitions being associated with respective ones of the FPGA dies. At least one multiplexing element is inserted into the first partition and a corresponding de-multiplexing element is inserted into the second partition based on the automated evaluation.

Abstract: A method for generating a circuit description for a multi-die field-programmable gate array, FPGA, comprising a first FPGA die and at least one further FPGA die is described. The method is performed in an FPGA design tool and comprises automatically evaluating a first and a second partition of a partitioned circuit description, the partitions being associated with respective ones of the FPGA dies. At least one multiplexing element is inserted into the first partition and a corresponding de-multiplexing element is inserted into the second partition based on the automated evaluation.

Abstract: A method for generating a circuit description for a multi-die field-programmable gate array, FPGA, comprising a first FPGA die and at least one further FPGA die is described. The method is performed in an FPGA design tool and comprises automatically evaluating a first and a second partition of a partitioned circuit description, the partitions being associated with respective ones of the FPGA dies. At least one multiplexing element is inserted into the first partition and a corresponding de-multiplexing element is inserted into the second partition based on the automated evaluation.

Abstract: A method for generating a circuit description for a multi-die field-programmable gate array, FPGA, comprising a first FPGA die and at least one further FPGA die is described. The method is performed in an FPGA design tool and comprises automatically evaluating a first and a second partition of a partitioned circuit description, the partitions being associated with respective ones of the FPGA dies. At least one multiplexing element is inserted into the first partition and a corresponding de-multiplexing element is inserted into the second partition based on the automated evaluation.

Abstract: A method for generating a circuit description for a multi-die field-programmable gate array, FPGA, comprising a first FPGA die and at least one further FPGA die is described. The method is performed in an FPGA design tool and comprises automatically evaluating a first and a second partition of a partitioned circuit description, the partitions being associated with respective ones of the FPGA dies. At least one multiplexing element is inserted into the first partition and a corresponding de-multiplexing element is inserted into the second partition based on the automated evaluation.

Abstract: A method for generating a circuit description for a multi-die field-programmable gate array, FPGA, comprising a first FPGA die and at least one further FPGA die is described. The method is performed in an FPGA design tool and comprises automatically evaluating a first and a second partition of a partitioned circuit description, the partitions being associated with respective ones of the FPGA dies. At least one multiplexing element is inserted into the first partition and a corresponding de-multiplexing element is inserted into the second partition based on the automated evaluation.

Abstract: The method of emulating the design under test associated with a test environment comprises two distinct generating phases comprising a first phase of generating (80) a first file (FCH1) for configuring the test environment, and a second phase of generating (81) a second file (FCH2) for configuring at least a part of the design under test, the delivery of the first configuration file to a first reconfigurable hardware part (BTR) forming a reconfigurable test bench so as to configure the test bench, and the delivery of the second configuration file to a second reconfigurable hardware part (EML) so as to configure an emulator of the design under test, the two hardware parts being distinct and mutually connected.