Patents by Inventor Frederic Truchetet

Frederic Truchetet has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8629400
    Abstract: The present invention relates to a 3D scanner (1) which is able to make 3D modeling of the transparent objects in real-time by utilizing the thermography technique in order to make quality control in the industry; comprising a slider (2), a heater (3), a thermal camera (5) and a control unit (6).
    Type: Grant
    Filed: December 16, 2008
    Date of Patent: January 14, 2014
    Assignee: Sabanci Universitesi
    Inventors: Gonen Eren, Aytul Ercil, Luis A. Sanchez, Olivier Aubreton, David Fofi, Fabrice Meriaudeau, Frederic Truchetet
  • Publication number: 20110248168
    Abstract: The present invention relates to a 3D scanner (1) which is able to make 3D modeling of the transparent objects in real-time by utilizing the thermography technique in order to make quality control in the industry; comprising a slider (2), a heater (3), a thermal camera (5) and a control unit (6).
    Type: Application
    Filed: December 16, 2008
    Publication date: October 13, 2011
    Applicant: SABANCI UNIVERSITESI
    Inventors: Gonen Eren, Aytul Ercil, Luis A. Sanchez, Olivier Aubreton, David Fofi, Fabrice Meriaudeau, Frederic Truchetet
  • Patent number: 5408104
    Abstract: An apparatus and a process for detecting surface defects on moving long metallic products utilizing linear CCD cameras for effecting exposures at successive times t1, t2,t3 . . . Tn. A processing device calculates differences observed for each pixel or assemble of pixels at the successive times and any variations in the differences makes it possible to detect defects and the extent of the defects. The use of thresholds allows for reduction in the background noise and different orientations of the optical axis of the camera permit the detection of different types of defects.
    Type: Grant
    Filed: June 10, 1993
    Date of Patent: April 18, 1995
    Assignee: Valinox
    Inventors: Patrick Gorria, Hafid Jender, Michel Paindavoine, Frederic Truchetet, Pascal Gerard, Phu-An Ngo