Abstract: A system for electronically inspecting fabric for defects wherein a moving fabric is scanned by light sensing apparatus for variations in light reflecting characteristics due to the presence of a defect. The sensitivity of the system is monitored by an automatic background control circuit to adapt the system to the light reflective characteristics of the particular fabric being inspected and alarm and defect counting apparatus indicates and records the presence of a defect. The system permits the inspection to be terminated upon the detection of a defect, or alternatively, the quality of the fabric can be determined by recording spaced defects during successive defect recordable time periods, the duration of such time periods being adjustable.

Abstract: The invention pertains to a defect detection system for inspecting fabric wherein fabric is scanned by electronic light-sensing apparatus for inconsistencies in light reflecting capability and defects produce electronic signals which are counted, and preferably, are automatically counted with respect to a predetermined time interval wherein fabric manufacturing apparatus may be automatically monitored to maintain a predetermined quality of product. Preferably, infrared frequencies are utilized for defect sensing purposes and electronic signal retention counting and timing apparatus automatically terminates fabric production if defect occurence exceeds a predetermined frequency in a given time interval.