Abstract: Methods, systems, and programs for recalibrating a sense amplifier. A representative method includes: measuring a physical property of a memory cell to produce a first measurement; comparing the first measurement to a first range, the first range being indicative of a short or open circuit in the memory cell; halting the sense of the selected memory cell if the first measurement exceeds the first range; comparing the first measurement to a second range, the second range being a predetermined range signifying a recalibration of the sense amplifier may be necessary; proceeding with the sense if the first measurement is within the first range and the second range; repeating the steps of measuring and comparing for a predetermined number of iterations, if after each iteration, the measurement exceeds the second range but is within the first range; and recalibrating the sense amplifier, if after the predetermined number of iterations, the measurement still exceeds the second range but is within the first range.

Abstract: A thin film device and a method of providing thermal assistance therein is disclosed. Accordingly, a heater material is utilized to thermally assist in the operation of the thin film device. By utilizing a heater material to thermally assist in the operation of the thin film device, a substantial improvement in the accuracy and performance of the thin film device is achieved. A first aspect of the present invention is a thin film device. The thin film device includes at least one patterned thin film layer, a heater material coupled to the at least one patterned thin film layer for providing thermal assistance to the at least one of the patterned thin film layers and a conductor coupled to the heater material for supplying energy to the heater material.

Abstract: A system and method of calibrating a read circuit in a magnetic memory is disclosed. In one embodiment, the method includes measuring a calibration value. A large error calibration is performed if the calibration value is within a maximum range. A small error calibration is performed if the calibration value is within a minimum range. The method may include performing a first read operation on the magnetic memory, and performing a second read operation on the magnetic memory.

Abstract: The invention includes an apparatus and a method that provides a memory back-up system. The memory back-up system includes a first memory cell, and a non-volatile memory cell that is interfaced to the first memory cell. Control circuitry allows data to be written to either the first memory cell or the non-volatile memory cell, and provides transfer of the data from either the first memory cell or the non-volatile memory cell, to the other of either the first memory cell or the non-volatile memory cell. The memory back-up system can also include a plurality of first memory cells, and a plurality of non-volatile memory cells that are interfaced to the first memory cells. Control circuitry allows data to be written to either the first memory cells or the non-volatile memory cells, and that provides transfer of the data from either the first memory cells or the non-volatile memory cells, to the other of either the first memory cells or the non-volatile memory cells.

Abstract: The invention includes an apparatus and a method for minimizing power supply sensitivity of a differential amplifier. The apparatus includes a current source providing a differential amplifier bias current to a common source node of the differential amplifier. A voltage sensor senses variations of a power supply associated with the current source. Variations sensed by the voltage sensor control a magnitude of the differential amplifier bias current. The method includes a current source providing the source current. A voltage potential of the common source node is sensed. The current source is adjusted depending upon the sensed voltage potential of the common source node, thereby adjusting a magnitude of the source current.

Abstract: A system and method for determining the logic state of a memory cell in a magnetic tunnel junction (MTJ) memory device based on the ratio of the current through the cell at different bias points are disclosed. A memory cell in an MJT memory device is sequentially subjected to at least two different bias voltages. The current through the cell at each of the bias voltages is measured, and a ratio of the different currents is determined. The ratio is then compared with a predetermined value to determine the logic state of the cell. The predetermined value can be a known value. Alternatively, the predetermined value can be determined by application of the system and method to a reference cell having a known logic state.

Abstract: A data storage device includes non-volatile memory; and a read circuit for performing multi-sample read operations on the memory during a normal mode of operation. The read circuit includes a digital counter having an output that indicates a single bit (e.g., a sign-bit). The read circuit allows an external device (e.g., a memory tester) to supply test clock pulses to an input of the digital counter during a test mode. The test clock pulses can be counted to determine a state of the digital counter.

Abstract: Power-saving reading of magnetic memory devices. In one arrangement, a method includes pulsing a voltage on the array, and obtaining a voltage value indicative of a memory state of the target memory cell from the voltage pulse using a sensing circuit that is electrically connected to the target memory cell. In another arrangement, a method includes pulsing an array voltage on a plurality of row and column conductors of the array, connecting a sensing circuit to a conductor that is electrically coupled to the target memory cell, the sensing circuit including a sense element, and determining the voltage drop across the sense element of the sensing circuit during the voltage pulse, the voltage drop being indicative of a memory state of the target memory cell.

Abstract: A method for making magnetic random access memories (MRAM) isolates each and every memory cell in an MRAM array during operation until selected. Some embodiments use series connected diodes for such electrical isolation. Only a selected one of the memory cells will then conduct current between respective ones of the bit and word lines. A better, more uniform distribution of read and data-write data access currents results to all the memory cells. In another embodiment, this improvement is used to increase the number of rows and columns to support a larger data array. In a further embodiment, such improvement is used to increase operating margins and reduce necessary data-write voltages and currents.

Abstract: A magnetic memory having a calibration system is disclosed. One embodiment of the magnetic memory includes a sense amplifier and a calibration system configured to monitor at least one operating parameter of the magnetic memory and calibrate the sense amplifier if a measured parameter corresponding to the at least one operating parameter is within a range.

Abstract: A memory includes an array of magnetic memory cells, each magnetic memory cell being adapted to store a bit of information, interconnects in communication with the magnetic memory cells, and conductors in communication with the magnetic memory cells and the interconnects, the conductors filling spaces between adjacent magnetic memory cells of the array.

Abstract: Embodiments of the present invention provide a resistive cross point memory. The resistive cross point memory comprises an array of memory cells and a read circuit. The read circuit is configured to sense a resistance through a memory cell in the array of memory cells to obtain a sense result and calibrate the read circuit based on the sensed result. The read circuit comprises an up/down counter that provides a calibration value to the read circuit.

Abstract: The invention includes an apparatus and a method for minimizing power supply sensitivity of a differential amplifier. The apparatus includes a current source providing a differential amplifier bias current to a common source node of the differential amplifier. A voltage sensor senses variations of a power supply associated with the current source. Variations sensed by the voltage sensor control a magnitude of the differential amplifier bias current. The method includes a current source providing the source current. A voltage potential of the common source node is sensed. The current source is adjusted depending upon the sensed voltage potential of the common source node, thereby adjusting a magnitude of the source current.

Abstract: A data storage device includes a cross point array of resistive memory elements and a plurality of blocking elements. The device is arranged in groups. Each group includes series-connected memory elements and a blocking element. The blocking elements are used to prevent sneak path currents from interfering with sense currents during read operations.

Abstract: The present invention provides a magnetic memory. In one embodiment, the magnetic memory includes a first line having a first cross-sectional area. A second line is provided having a second cross-sectional area different from the first cross-sectional area. A magnetic memory cell stack is positioned between the first line and the second line.

Abstract: One embodiment of a magnetic memory includes a magnetic memory stack and a first line adjacent the magnetic memory stack. A second line crosses the first line, and a third line crosses the first line and the second line. The third line is angled relative to the first line and the second line, where the first line, the second line and the third line are configured to produce magnetic fields that set states of the magnetic memory stack.

Abstract: A system and method of calibrating a read circuit in a magnetic memory is disclosed. In one embodiment, the method includes measuring a calibration value. A large error calibration is performed if the calibration value is within a maximum range. A small error calibration is performed if the calibration value is within a minimum range. The method may include performing a first read operation on the magnetic memory, and performing a second read operation on the magnetic memory.

Abstract: A data storage device that includes an array of resistive memory cells. The resistive memory cells may include a magnetic tunnel junction (MTJ) and a thin-film diode. The device may include a circuit that is electrically connected to the array and that is also capable of monitoring a signal current flowing through a selected memory cell. Once the signal current has been monitored, the circuit is capable of comparing the signal current to an average reference current in order to determine which of a first resistance state and a second resistance state the selected memory cell is in. Also, a method for operating the data storage device.

Abstract: Embodiments of the present invention provide a memory device. In one embodiment, the memory device comprises an array of memory cells configured to provide resistive states, a read circuit configured to sense the resistive states and a resistor. The resistor is configured to provide a resistance to the read circuit that is configured to select the resistor and sense the resistance to test the read circuit.

Abstract: A resistive cross point memory cell array comprising a plurality of word lines, a plurality of bit lines, a plurality of cross points formed by the word lines and the bit lines, and a plurality of memory cells, each of the memory cells being located at a different one of the cross points, wherein a first bit line comprises a distributed series diode along an entire length of the bit line such that each of the associated memory cells located along the first bit line is coupled between the distributed series diode and an associated word line.