Patents by Inventor Frederick Seng

Frederick Seng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical inspection based on repetitive feature comparison
    Patent number: 12444068
    Abstract: A computer-based system may quantify, based on the plurality of instances of a feature indicated by image data, an attribute (e.g., a color, a shape, a material, a texture, etc.) of the plurality of instances of the feature. The system may also quantify an attribute of an instance of the feature of the plurality of instances of the feature. The system may modify the image data to indicate the instance of the feature if/when a value of the quantified attribute of the instance of the feature exceeds a value of the quantified attribute of the plurality of instances of the feature by a threshold. Functionality (e.g., defective, non-defective, potentially defective, etc.) of the unit may be classified based on the modified image data.
    Type: Grant
    Filed: August 1, 2022
    Date of Patent: October 14, 2025
    Assignee: LG INNOTEK CO., LTD.
    Inventors: Frederick Seng, Harold Hwang, Brian Piccione, Kuen-Ting Shiu
  • Optical Inspection Based on Repetitive Feature Comparison
    Publication number: 20240037768
    Abstract: A computer-based system may quantify, based on the plurality of instances of a feature indicated by image data, an attribute (e.g., a color, a shape, a material, a texture, etc.) of the plurality of instances of the feature. The system may also quantify an attribute of an instance of the feature of the plurality of instances of the feature. The system may modify the image data to indicate the instance of the feature if/when a value of the quantified attribute of the instance of the feature exceeds a value of the quantified attribute of the plurality of instances of the feature by a threshold. Functionality (e.g., defective, non-defective, potentially defective, etc.) of the unit may be classified based on the modified image data.
    Type: Application
    Filed: August 1, 2022
    Publication date: February 1, 2024
    Applicant: LG INNOTEK CO., LTD.
    Inventors: Frederick Seng, Harold HWANG, Brian PICCIONE, Kuen-Ting SHIU