Patents by Inventor Frederico Rhae Maciel Leal

Frederico Rhae Maciel Leal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Advanced memory test diagnostics
    Patent number: 9443613
    Abstract: For performing advanced memory test diagnostics, an apparatus, method, and computer program product are disclosed. The apparatus may include a processor, a memory that stores code executable by the processor, an address space module that identifies an address space having a plurality of blocks of memory addresses, a memory diagnostic module that performs, at least three times, a memory test procedure using a block pattern, wherein a first block pattern is used the first time, a second block pattern is used the second time, and a third block pattern is used the third time, and a memory fault module that determines the presence of a memory fault based on results of the memory test procedures.
    Type: Grant
    Filed: March 28, 2014
    Date of Patent: September 13, 2016
    Assignee: Lenovo (Singapore) PTE. LTD.
    Inventors: Arnold S. Weksler, André Breda Carneiro, Rodrigo Fernandes Freitas, Frederico Rhae Maciel Leal, Marcelo Araujo Lima, Fernando José Vieira da Silva, Fernando Ferraz Silva, Francisco Plinio Oliveira Silveira
  • ADVANCED MEMORY TEST DIAGNOSTICS
    Publication number: 20150279485
    Abstract: For performing advanced memory test diagnostics, an apparatus, method, and computer program product are disclosed. The apparatus may include a processor, a memory that stores code executable by the processor, an address space module that identifies an address space having a plurality of blocks of memory addresses, a memory diagnostic module that performs, at least three times, a memory test procedure using a block pattern, wherein a first block pattern is used the first time, a second block pattern is used the second time, and a third block pattern is used the third time, and a memory fault module that determines the presence of a memory fault based on results of the memory test procedures.
    Type: Application
    Filed: March 28, 2014
    Publication date: October 1, 2015
    Applicant: LENOVO (SINGAPORE) PTE, LTD.
    Inventors: Arnold S. Weksler, André Breda Carneiro, Rodrigo Fernandes Freitas, Frederico Rhae Maciel Leal, Marcelo Araujo Lima, Fernando José Vieira da Silva, Fernando Ferraz Silva, Francisco Plinio Oliveira Silveira