Patents by Inventor Fredrick J Brechtel
Fredrick J Brechtel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10261049Abstract: A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.Type: GrantFiled: July 11, 2018Date of Patent: April 16, 2019Assignee: Brechtel Manufacturing, Inc.Inventors: Fredrick J Brechtel, Xerxes Lopez-Yglesias
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Publication number: 20180321190Abstract: A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.Type: ApplicationFiled: July 11, 2018Publication date: November 8, 2018Applicant: Brechtel Manufacturing, Inc.Inventors: Fredrick J. Brechtel, Xerxes Lopez-Yglesias
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Patent number: 10078068Abstract: A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.Type: GrantFiled: August 8, 2017Date of Patent: September 18, 2018Assignee: Brechtel ManufacturingInventors: Fredrick J Brechtel, Xerxes Lopez-Yglesias
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Publication number: 20170356879Abstract: A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.Type: ApplicationFiled: August 8, 2017Publication date: December 14, 2017Inventors: Fredrick J. Brechtel, Xerxes Lopez-Yglesias
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Patent number: 9759685Abstract: A system and method comprising an ion production chamber having a ultra-violet light source disposed towards said chamber, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet, said jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. The charge sample may be coupled to a MEMS-based electrometer.Type: GrantFiled: July 15, 2015Date of Patent: September 12, 2017Assignee: Brechtel Manufacturing, Inc.Inventors: Fredrick J Brechtel, Xerxes Lopez-Yglesias
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Patent number: 9753013Abstract: A system and method comprising a charger for ionizing aerosols; a spectrometer coupled to the charger and operable to select for a predetermined particle size; a porous charge collector coupled to the spectrometer, and a MEMS electrometer. In some embodiments the charge collector may be a metal frit electrically coupled to the electrometer. The electrometer may include a comb drive actuator coupled to a moving shuttle supported on flexures.Type: GrantFiled: May 17, 2014Date of Patent: September 5, 2017Assignee: Brechtel Manufacturing, Inc.Inventors: Fredrick J Brechtel, David A. Horsley, Gerardo Jaramillo
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Publication number: 20150330944Abstract: A system and method comprising an ion production chamber having a ultra-violet light source disposed towards said chamber, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet, said jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. The charge sample may be coupled to a MEMS-based electrometer.Type: ApplicationFiled: July 15, 2015Publication date: November 19, 2015Applicant: BRECHTEL MANUFACTURING, INC.Inventors: Fredrick J. BRECHTEL, Xerxes Lopez-Yglesias
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Patent number: 9018598Abstract: A system and method comprising an ion production chamber having a plasma source disposed in said chamber, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet, said jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. The charge sample may be coupled to a MEMS-based electrometer.Type: GrantFiled: May 16, 2014Date of Patent: April 28, 2015Assignee: Brechtel Manufacturing, Inc.Inventor: Fredrick J Brechtel