Patents by Inventor Fredrik Maurer

Fredrik Maurer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for optical film measurements in a controlled environment
    Patent number: 7130038
    Abstract: An optical probe (and method) for measuring a surface in an environment containing a first substance, includes a light source for transmitting a light onto an area of the surface to obtain a measurement, a source of the first substance including one of a fluid and a gas for displacing a second substance from an area of the surface receiving the light, and a measuring device for receiving the light being reflected from the surface and for determining a measurement of the surface based upon the reflected light.
    Type: Grant
    Filed: September 1, 2005
    Date of Patent: October 31, 2006
    Assignee: International Business Machines Corporation
    Inventors: Richard J. Lebel, Fredrik Maurer, Paul H. Smith, Jr., Theodore G. Van Kessel, Hematha K. Wickramasinghe
  • Method and apparatus for optical film measurements in a controlled environment
    Publication number: 20050286056
    Abstract: An optical probe (and method) for measuring a surface in an environment containing a first substance, includes a light source for transmitting a light onto an area of the surface to obtain a measurement, a source of the first substance including one of a fluid and a gas for displacing a second substance from an area of the surface receiving the light, and a measuring device for receiving the light being reflected from the surface and for determining a measurement of the surface based upon the reflected light.
    Type: Application
    Filed: September 1, 2005
    Publication date: December 29, 2005
    Applicant: International Business Machines Corporation
    Inventors: Richard Lebel, Fredrik Maurer, Paul Smith, Theodore Van Kessel, Hematha Wickramasinghe
  • Method and apparatus for optical film measurements in a controlled environment
    Patent number: 6967715
    Abstract: An optical probe (and method) for measuring a surface in an environment containing a first substance, includes a light source for transmitting a light onto an area of the surface to obtain a measurement, a source of the first substance including one of a fluid and a gas for displacing a second substance from an area of the surface receiving the light, and a measuring device for receiving the light being reflected from the surface and for determining a measurement of the surface based upon the reflected light.
    Type: Grant
    Filed: December 6, 2002
    Date of Patent: November 22, 2005
    Assignee: International Business Machines Corporation
    Inventors: Richard J. Lebel, Fredrik Maurer, Paul H. Smith, Jr., Theodore G. Van Kessel, Hematha K. Wickramasinghe
  • Method and apparatus for optical film measurements in a controlled environment
    Publication number: 20040109174
    Abstract: An optical probe (and method) for measuring a surface in an environment containing a first substance, includes a light source for transmitting a light onto an area of the surface to obtain a measurement, a source of the first substance including one of a fluid and a gas for displacing a second substance from an area of the surface receiving the light, and a measuring device for receiving the light being reflected from the surface and for determining a measurement of the surface based upon the reflected light.
    Type: Application
    Filed: December 6, 2002
    Publication date: June 10, 2004
    Applicant: International Business Machines Corporation
    Inventors: Richard J. Lebel, Fredrik Maurer, Paul H. Smith, Theodore G. Van Kessel, Hematha K. Wickramasinghe