Patents by Inventor Friedhelm Dorsch

Friedhelm Dorsch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11925999
    Abstract: A workpiece processing machine that includes: a beam emission head for providing a beam for processing the workpiece, an optical interferometer for splitting, redirecting, and detecting the beam, an adjustment element for changing a second portion of a power of the beam redirected from a retroreflector to a detector, and a control unit for actuating the adjustment element to control a ratio between a first power portion of the beam redirected from the workpiece to the detector and the second power portion of the beam redirected from the retroreflector to the detector to a target ratio.
    Type: Grant
    Filed: April 15, 2020
    Date of Patent: March 12, 2024
    Assignee: TRUMPF Laser- und Systemtechnik GmbH
    Inventors: Jan-Patrick Hermani, Steffen Kessler, Friedhelm Dorsch, Holger Braun
  • Publication number: 20200238436
    Abstract: A workpiece processing machine that includes: a beam emission head for providing a beam for processing the workpiece, an optical interferometer for splitting, redirecting, and detecting the beam, an adjustment element for changing a second portion of a power of the beam redirected from a retroreflector to a detector, and a control unit for actuating the adjustment element to control a ratio between a first power portion of the beam redirected from the workpiece to the detector and the second power portion of the beam redirected from the retroreflector to the detector to a target ratio.
    Type: Application
    Filed: April 15, 2020
    Publication date: July 30, 2020
    Inventors: Jan-Patrick Hermani, Steffen Kessler, Friedhelm Dorsch, Holger Braun
  • Patent number: 9501821
    Abstract: Detection of defects during a machining process includes: moving a laser beam along a predefined path over multiple workpieces to be machined so as to generate a weld seam or a cutting gap in the workpieces; detecting, in a two-dimensional spatially resolved detector field of a detector, radiation emitted and/or reflected by the multiple workpieces; selecting at least one detection field section in the detection field of the detector based on laser beam control data defining movement of the laser beam along the predefined path or based on a previously determined actual-position data of the laser beam along the predefined path, wherein each detection field section comprises a region encompassing less than the entire detection field; evaluating the radiation detected in the selected detection field section; and determining whether a defect exists at the weld seam or the cutting gap based on the evaluated radiation.
    Type: Grant
    Filed: December 26, 2013
    Date of Patent: November 22, 2016
    Assignee: TRUMPF Laser-und Systemtechnik GmbH
    Inventors: Dieter Pfitzner, Holger Braun, Friedhelm Dorsch
  • Patent number: 8890023
    Abstract: This disclosure relates to verifying a seam quality during a laser welding process. In certain aspects, a method includes detecting, in a spatially resolved manner, a first amount of radiation emerging from a workpiece in a first wavelength range, determining a first geometric parameter of a seam characteristic based on the first amount of radiation detected in the first wavelength range, detecting, in a spatially resolved manner, a second amount of radiation emerging from the workpiece in a second wavelength range, the second wavelength range being different than the first wavelength range, determining a second geometric parameter of the seam characteristic based on the second amount of radiation detected in the second wavelength range, comparing the first and second geometric parameters to respective reference values or to respective tolerance intervals to provide respective comparison results, and logically combining the respective comparison results to verify the seam quality.
    Type: Grant
    Filed: September 5, 2012
    Date of Patent: November 18, 2014
    Assignee: TRUMPF Werkzeugmaschinen GmbH + Co. KG
    Inventors: Friedhelm Dorsch, Holger Braun, Dieter Pfitzner
  • Publication number: 20140175071
    Abstract: Detection of defects during a machining process includes: moving a laser beam along a predefined path over multiple workpieces to be machined so as to generate a weld seam or a cutting gap in the workpieces; detecting, in a two-dimensional spatially resolved detector field of a detector, radiation emitted and/or reflected by the multiple workpieces; selecting at least one detection field section in the detection field of the detector based on laser beam control data defining movement of the laser beam along the predefined path or based on a previously determined actual-position data of the laser beam along the predefined path, wherein each detection field section comprises a region encompassing less than the entire detection field; evaluating the radiation detected in in the selected detection field section; and determining whether a defect exists at the weld seam or the cutting gap based on the evaluated radiation.
    Type: Application
    Filed: December 26, 2013
    Publication date: June 26, 2014
    Applicant: TRUMPF Laser - und Systemtechnik GmbH
    Inventors: Dieter Pfitzner, Holger Braun, Friedhelm Dorsch
  • Publication number: 20130062324
    Abstract: This disclosure relates to verifying a seam quality during a laser welding process. In certain aspects, a method includes detecting, in a spatially resolved manner, a first amount of radiation emerging from a workpiece in a first wavelength range, determining a first geometric parameter of a seam characteristic based on the first amount of radiation detected in the first wavelength range, detecting, in a spatially resolved manner, a second amount of radiation emerging from the workpiece in a second wavelength range, the second wavelength range being different than the first wavelength range, determining a second geometric parameter of the seam characteristic based on the second amount of radiation detected in the second wavelength range, comparing the first and second geometric parameters to respective reference values or to respective tolerance intervals to provide respective comparison results, and logically combining the respective comparison results to verify the seam quality.
    Type: Application
    Filed: September 5, 2012
    Publication date: March 14, 2013
    Applicant: TRUMPF WERKZEUGMASCHINEN GMBH + CO. KG
    Inventors: Friedhelm Dorsch, Holger Braun, Dieter Pfitzner
  • Patent number: 7773653
    Abstract: A diode laser apparatus includes a plurality of laser bars, each laser bar having an emission direction and a beam path. The laser bars are disposed along an arc, the emission directions of the laser bars are directed toward an inside of the arc, and a slow-axis direction of each laser bar is oriented along the arc.
    Type: Grant
    Filed: July 19, 2005
    Date of Patent: August 10, 2010
    Assignee: TRUMPF LASER GmbH + Co. KG
    Inventors: Andreas Voss, Martin Liermann, Friedhelm Dorsch, Klaus Wallmeroth, Malte Kumkar, Christian Schmitz
  • Publication number: 20060018356
    Abstract: A diode laser apparatus includes a plurality of laser bars, each laser bar having an emission direction and a beam path. The laser bars are disposed along an arc, the emission directions of the laser bars are directed toward an inside of the arc, and a slow-axis direction of each laser bar is oriented along the arc.
    Type: Application
    Filed: July 19, 2005
    Publication date: January 26, 2006
    Inventors: Andreas Voss, Martin Liermann, Friedhelm Dorsch, Klaus Wallmeroth, Malte Kumkar, Christian Schmitz
  • Patent number: 6535533
    Abstract: Mounting substrate and heat sink for high-power diode laser bars, the mounting substrate permitting mounting of the high-power diode laser bars by hard-soldering on the basis of a matching expansion to the semiconductor material. The mounting substrate is difficult to bend and of extremely high thermal conductivity, and can be used universally for the various cooling elements of conductive and convective cooling mechanisms.
    Type: Grant
    Filed: March 2, 2001
    Date of Patent: March 18, 2003
    Assignee: Jenoptik Aktiengesellschaft
    Inventors: Dirk Lorenzen, Friedhelm Dorsch
  • Publication number: 20010048698
    Abstract: Mounting substrate and heat sink for high-power diode laser bars, the mounting substrate permitting mounting of the high-power diode laser bars by hard-soldering on the basis of a matching expansion to the semiconductor material. The mounting substrate is difficult to bend and of extremely high thermal conductivity, and can be used universally for the various cooling elements of conductive and convective cooling mechanisms.
    Type: Application
    Filed: March 2, 2001
    Publication date: December 6, 2001
    Inventors: Dirk Lorenzen, Friedhelm Dorsch
  • Patent number: 5920584
    Abstract: A high-power diode laser and a method for mounting same are described. Predetermined breaking locations in the laser bar are provided which, during cooling after the laser bar has been soldered to a heat sink having a smaller thermal expansion coefficient, lead to breakage at defined locations between the single laser diodes of the laser bar. As a result of the physical division of the laser bar, it is possible to use a solder which has low ductility (hard solder) at room temperature, since destruction of the single laser diodes of the laser bar as a result of mechanical stresses can be ruled out.
    Type: Grant
    Filed: October 23, 1997
    Date of Patent: July 6, 1999
    Assignee: Jenoptik Aktiengesellschaft
    Inventors: Rainer Dohle, Stefan Heinemann, Dirk Lorenzen, Friedhelm Dorsch, Franz Daiminger