Abstract: Described are a method and apparatus for analysing an optical device, including: a) arranging an illuminating device which generates a test beam, the optical device that the test beam passes and a position-resolving sensor device which detects the test beam, relative to each other in a reference position that establishes a reference beam path; b) transmitting the test beam in a plurality of relative positions off set with respect to the reference position, relative to the reference position, the test beam being incident upon a measuring point assigned to the respective relative position on the optical device; c) detecting, for a respective relative position, a position of incidence of the test beam, after it passes the optical device, on one or a plurality of planes of detection offset relative to each other; d) determining the beam path of the test beam from the positions of incidence detected in step c) for each relative position and calculating optical characteristics of the optical device.

Abstract: Described are a method and apparatus for analysing an optical device, including: a) arranging an illuminating device which generates a test beam, the optical device that the test beam passes and a position-resolving sensor device which detects the test beam, relative to each other in a reference position that establishes a reference beam path; b) transmitting the test beam in a plurality of relative positions off set with respect to the reference position, relative to the reference position, the test beam being incident upon a measuring point assigned to the respective relative position on the optical device; c) detecting, for a respective relative position, a position of incidence of the test beam, after it passes the optical device, on one or a plurality of planes of detection offset relative to each other; d) determining the beam path of the test beam from the positions of incidence detected in step c) for each relative position and calculating optical characteristics of the optical device.

Abstract: A suspension arm (300) of a disk storage device has an elastic portion (310) with thickness d1 and a rigid portion (320) with thickness d2. At the free end of the suspension arm, a slider (325) is mounted on the suspension arm. The bottom surface of the slider has a distance FH to a top surface of a hard disk (329). The suspension arm particularly comprises a heating element (330) disposed on the suspension arm. An electric current Ic flowing through electrical supply wires (350) causes the temperature of the suspension arm locally to rise and therefore its spring constant to decrease. Together with the force Fa resulting from the air cushion effect of the slider a new equilibrium flying height FH is stabilized.

Abstract: A method and apparatus for recording and storing information on and reproducing information from a storage medium is described, wherein the active storage medium forms part of the write/read signal path.

Abstract: Briefly, in a preferred embodiment, the present invention comprises a suspension having a structured surface hardening. This surface hardening may be comprised of thin film stripes of material such as nitrides, carbides, and adamantine carbon. The hardened layer has a thickness in the range of 10-100 nm.

Abstract: A suspension arm (300) of a disk storage device has an elastic portion (310) with thickness d1 and a rigid portion (320) with thickness d2. At the free end of the suspension arm, a slider (325) is mounted on the suspension arm. The bottom surface of the slider has a distance FH to a top surface of a hard disk (329). The suspension arm particularly comprises a heating element (330) disposed on the suspension arm. An electric current Ic flowing through electrical supply wires (350) causes the temperature of the suspension arm locally to rise and therefore its spring constant to decrease. Together with the force Fa resulting from the air cushion effect of the slider a new equilibrium flying height FH is stabilized.

Abstract: A process permits the determination of multi-dimensional distribution of magnetic fields. The process uses a magneto-resistive sensor as a physical measuring device. The measuring device is coupled with a method for algebraic reconstruction so that sectional images of the field distribution are calculated from individual measurements of the magneto-resistive effect using the algebraic reconstruction.

Abstract: A magnetic disk tester which also incorporates a sensor such as an AFM or MFM is described. The device is able directly and quickly to detect and characterize sub-micrometric defects on the surface of magnetic disks. A process for finding and characterizing defects on a magnetic disk according to the invention comprises the steps of rotating the magnetic disk using a spindle motor; writing data on the magnetic disk at selected positions; finding a position on the magnetic disk having a defect which produces an error when reading the data from the magnetic disk; determining coordinates of the defect referenced from an index on the disk; stopping the spindle motor; positioning a sensing device such as an AFM or MFM head over the defect; and sensing characteristics of the defect which aid in determining a cause of the defect.