Patents by Inventor Friedrich HECKER

Friedrich HECKER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10082485
    Abstract: In a method for leakage flux testing of ferromagnetic material to be tested, in particular ferromagnetic pipes, for detecting defects, a testing volume of the material to be tested is magnetized by a constant magnetic field. A surface of the material to be tested is scanned by a probe arrangement for capturing magnetic leakage fields caused by defects. The probe arrangement has a probe array with a multiplicity of magnetic-field-sensitive probes arranged next to one another in a first direction and held at a finite testing distance from the surface of the material to be tested during the testing. Electrical probe signals are evaluated for qualifying the defects. Use is made of a probe arrangement in which the probes each have a probe width in the first direction which lies in the range from 20% of the testing distance up to 10 mm.
    Type: Grant
    Filed: May 4, 2015
    Date of Patent: September 25, 2018
    Assignee: Institut Dr. Foerster GmbH & Co. KG
    Inventors: Robert P. Uhlig, Friedrich Hecker
  • Publication number: 20170160236
    Abstract: In a method for leakage flux testing of ferromagnetic material to be tested, in particular ferromagnetic pipes, for detecting defects, a testing volume of the material to be tested is magnetized by a constant magnetic field. A surface of the material to be tested is scanned by a probe arrangement for capturing magnetic leakage fields caused by defects. The probe arrangement has a probe array with a multiplicity of magnetic-field-sensitive probes arranged next to one another in a first direction and held at a finite testing distance from the surface of the material to be tested during the testing. Electrical probe signals are evaluated for qualifying the defects. Use is made of a probe arrangement in which the probes each have a probe width in the first direction which lies in the range from 20% of the testing distance up to 10 mm.
    Type: Application
    Filed: May 4, 2015
    Publication date: June 8, 2017
    Inventors: Robert P. UHLIG, Friedrich HECKER