Abstract: The interferometric measuring device (1) for measuring the shape of a surface of an object (O) has a radiation source (LQ), a beam splitter (ST) producing an object beam (OS) guided along an object light path to the object (O) and a reference beam (RS) guided along a reference light path to a reflective reference plane (RSP), an image recorder (BA) that records interfering radiation reflected by the object (O) and the reference plane (RSP) and an associated evaluation device (E) to determine the surface shape. A favorable adaptability and operation are achieved by arrangement of a fixed lens system (SO) that produces a fixed intermediate image (SZB) in the object light path and a movable lens system (BO) that is movable in a direction of its optical axis for depth scanning. The image recorder (BA) has pixels arranged next to each other on an extended planar surface.

Abstract: The present invention relates to an optical measuring device (1) for measuring the shape of particularly rough surfaces of a test object (O), the measuring device including a device that has at least one light source (LQ), one illumination optics, one measuring optics, and at least one detection unit, for determining the intensity distribution of a measuring beam reflected from the surface as a function of a focus position relative to the object surface. A simple measurement even of highly inaccessible locations on the test object is made possible by the fact that the measuring optics has an optical probe for generating at least one intermediate image (ZW) of the observed surface area (FIG. 1).

Abstract: An interferometric measuring device for measuring the shape of a surface of an object having a radiation source which emits a short-coherent radiation, a beam splitter for forming an object beam which is directed via an object light path to the object, and a reference beam which is directed via a reference light path to a reflective reference plane, and having an image converter which picks up the radiation reflected back by the surface and the reference plane and brought to interference, and sends it to an analyzing device for determining a measuring result pertaining to the surface, the optical length of the object light path being changed relative to the optical length of the reference light path for analyzing the interference peak.

Abstract: An interferometric measuring device for measuring the shape of a surface of an object has a radiation source which emits a short-coherent radiation, a beam splitter for forming an object beam which is directed via an object light path to the object and a reference beam which is directed via a reference light path to a reflective reference plane. The interferometric measuring device also has an image converter which picks up the radiation that has been brought to interference and reflected back from the surface and the reference plane and sends it to an analyzing device for determining a measurement result pertaining to the surface. To analyze the interference peak by scanning, the optical length of the object light path is altered relative to the optical length of the reference light path, or an intermediate image of the surface produced in the object light path is scanned.

Abstract: The invention relates to an interferometric measuring device (1) for measuring the shape of a surface of an object (O), with a radiation source (LQ) that emits a short coherence radiation, a beam splitter (ST) for producing an object beam (OS), which is guided along an object light path to the object (O), and a reference beam (RS), which is guided along a reference light path to a reflective reference plane (RSP), and with an image recorder (BA) that records the radiation, which is reflected by the object (O) and the reference plane (RSP) and is brought into interference, and supplies it to an evaluation device to determine the surface shape. A favorable adaptability and operation, even in measuring locations that are difficult to access is achieved by virtue of the fact that a lens system (SO), which is fixed in relation to the object (O), is disposed in the object light path and that the fixed lens system (SO) is followed by a lens system (BO) that can move in the direction of its optical axis.

Abstract: An interferometric measuring device is described for measuring the shape of a surface (A) of an object (BO) having a radiation source (KL) which emits a short-coherent radiation, a beam splitter (ST) for forming an object beam which is directed via an object light path (OW) to the object (BO) and a reference beam which is directed via a reference light path (RW) to a reflective reference plane (TS, SP1) and having an image converter (BW) which picks up the radiation that has been brought to interference and reflected back from the surface (A) and the reference plane (TS, SP1) and sends it to an analyzing device for determining a measurement result pertaining to the surface (A); to analyze the interference peak by scanning, the optical length of the object light path (OW) is altered relative to the optical length of the reference light path (RW), or an intermediate image (ZA) of the surface (A) produced in the object light path (OW) is scanned.

Abstract: The present invention relates to an optical measuring device (1) for measuring the shape of particularly rough surfaces of a test object (O), the measuring device including a device that has at least one light source (LQ), one illumination optics, one measuring optics, and at least one detection unit, for determining the intensity distribution of a measuring beam reflected from the surface as a function of a focus position relative to the object surface. A simple measurement even of highly inaccessible locations on the test object is made possible by the fact that the measuring optics has an optical probe for generating at least one intermediate image (ZW) of the observed surface area (FIG. 1).

Abstract: The present invention relates to an interferometric measuring device for measuring the shape of a surface (A) of an object (BO) having a radiation source (KL) which emits a short-coherent radiation, a beam splitter (ST) for forming an object beam which is directed via an object light path (OW) to the object (BO), and a reference beam which is directed via a reference light path (RW) to a reflective reference plane (SP1), and having an image converter (BW) which picks up the radiation reflected back by the surface (A) and the reference plane (SP1) and brought to interference, and sends it to an analyzing device for determining a measuring result pertaining to the surface (A), the optical length of the object light path (OW) being changed relative to the optical length of the reference light path (RW) for analyzing the interference peak.

Abstract: An apparatus is proposed for making absolute, two-dimensional measurements of the position of an object (10) with reference to a measuring arrangement (11), with the surface of the object (10) being configured as a hologram. The information contained in the hologram is red out by means of a measuring wave (13) that is directed onto the hologram (18), is diffracted there and interferes with a reference wave (14). The interfered-with waves (13, 14) are picked up by an optical sensor arrangement (20) including at least two sensors (21, 22). In a signal processing arrangement (23), the absolute position is determined either from the radiation intensities picked up by the sensors (21, 22) or from the phase relationship between the signals emitted by the sensors (21, 22), in each case by a comparison with a value stored in a memory.

Abstract: The optic axis of a vehicle headlight comprises a reflector, an incandescent helix and a convergent lens. The reflection surface of the reflector is parabolic in the horizontal midplane section and is elliptical in vertical median section. A narrow band of light spreading out laterally is thus produced without supplementary optical components, particularly the diffusion disk or dispersion lens. A sharp light-to-dark boundary is obtained by a diaphragm having an effective straight edge 18 located below the outer ellipse focus, which is coincident with that one of the principal foci of the converging lens which is the nearer to the reflector.