Abstract: The invention relates to a method for microscopically examining a sample, wherein, in an overview mode, first an overview image of the sample composed of a large number of individual images is recorded through a microscope (20) followed by a transition to a detail mode, in which detail images of regions of interest of the sample are recorded through said microscope. The method is characterized in that the recording of the overview image in the overview mode is carried out at a lower resolution of the respectively used camera than that employed for the recording of the detail images and that the overview image and the detail images are recorded using the same microscope objective. Furthermore, the invention relates to a device for microscopically examining a sample, a computer program and a computer program product.