Patents by Inventor Frithjof Asmussen

Frithjof Asmussen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4870265
    Abstract: A position-sensitive radiation detector includes a substrate and an electrically conductive electrode system which is arranged on a surface of said substrate and the configuration and arrangement of which permits position determination of a charge carrier beam impinging thereon. The substrate and the electrode system each consist of a transparent material, for example glass, or a mixture of indium oxide and tin oxide. Disposed on the electrode system is a layer of luminescent material. The present radiation detector permits at the same both an electronic and an optical signal acquisition, the latter for example photographically, visually or by means of an optoelectronic device, such as a video camera, which picks up the light passing through the substrate. Due to the combined electronic and optical signal acquisition the radiation detector can be used in a very large intensity range.
    Type: Grant
    Filed: November 13, 1987
    Date of Patent: September 26, 1989
    Assignee: Max-Planck Gesellschaft zur Foerderung der Wissenschaften eV
    Inventors: Frithjof Asmussen, Thomas Schiller, Uwe Weigmann
  • Patent number: 4656119
    Abstract: A method of producing X-ray resist with etching patterns, using known supports which are coated with a film comprised of copolymers of methacrylonitrile and methacrylic acid is disclosed. This method uses the following protocol.(a) A copolymer of methacrylonitrile and methacrylic acid with molecular weight <700,000 is used for coating the support.(b) Before X-ray irradiation, the film is thermally treated at temperatures below 150.degree. C. until a solvent-free, uncrosslinked film is obtained.(c) After the X-ray irradiation, the film is tempered for 15-30 min at temperatures in the range 140.degree.-170.degree. C.(d) And subsequently the film is developed with a solvent system L comprised of water and/or an organic solvent which contains oxygen in the form of a hydroxyl group and/or an ether group and/or an ester group.
    Type: Grant
    Filed: November 27, 1985
    Date of Patent: April 7, 1987
    Assignees: Rohm GmbH Chemische Fabrik, Max-Planck-Gesellschaft Zur Foerderund der Wissenschaften
    Inventors: Frithjof Asmussen, Wolfgang Gaenzler, Winfried Wunderlich
  • Patent number: 4581401
    Abstract: A radiation sensitive polymeric material comprising a copolymer of methyl methacrylate and allyl methacrylate and at least one organosulfur compound having at least two --SH groups per molecule, said material being useful as a polymer resist sensitive to high energy radiation.
    Type: Grant
    Filed: September 19, 1984
    Date of Patent: April 8, 1986
    Assignee: Rohm GmbH
    Inventors: Frithjof Asmussen, Peter Quis, Winfried Wunderlich, Wolfram Schnabel, Hideto Sotobayashi
  • Patent number: 4551414
    Abstract: The invention relates to positive resist materials of thermally crosslinkable methacrylic polymers soluble in organic solvents, which are characterized in that the methacrylic polymers are copolymers of 80 to 98 mol-% of fluoroalkylmethacrylate and 20 to 2 mol-% of methacrylic acid chloride or chloroalkylmethacrylate. The resists of the invention are very well suited for the transfer of microstructures, for example in semiconductor technology. They have, in addition to a high sensitivity, a very good mechanical stability and strength of adhesion.
    Type: Grant
    Filed: February 3, 1983
    Date of Patent: November 5, 1985
    Assignee: Max-Planck-Gesellshaft zur Forderung der Wissenschaften e.V.
    Inventors: Frithjof Asmussen, Hideto Sotobayashi, Jiang-Tsun Chen, Wolfram Schnabel