Abstract: An apparatus and method for producing a substantially straight instrument image is provided. The apparatus and method for producing a substantially straight instrument image, according to the present invention includes a curved slit. The curved slit may be formed in a light beam controller. The curved slit is capable of admitting a light beam into the instrument. The instrument parameters associated with optical devices located in the instrument in the path of the light beam are determined. One or more formulae are used to transform and process the instrument spectral parameters to determine the shape or curvature of the curved slit.

Abstract: An apparatus and method for producing a substantially straight instrument image is provided. The apparatus and method for producing a substantially straight instrument image, according to the present invention includes a curved slit. The curved slit may be formed in a light beam controller. The curved slit is capable of admitting a light beam into the instrument. The instrument parameters associated with optical devices located in the instrument in the path of the light beam are determined. One or more formulae are used to transform and process the instrument spectral parameters to determine the shape or curvature of the curved slit.

Abstract: Apparatus and method for using the apparatus are provided, where the apparatus provides for a light beam of variable area in a narrow wavelength band, where the size of the beam incident on a sample and relative movement of the sample and light irradiation and collection means is carefully controlled, so as to vary the site of interrogation. A discrete element collector system is used to efficiently collect the emitted light from the sample and direct it to a focusing lens, filter pack and photodetector for collection of the light and transmitting signals to electronic circuitry for analysis.

Abstract: A luminescence measuring system is provided for detecting luminescence at extremely low concentrations of luminescing moieties. The method employs alternating radiation at a plurality of loci of an inhomogenous solution, where the radiant power is maintained constant, and the irradiated volumes of pairs of loci are systematically varied. With the probability being very low that the same luminescence signal will be obtained in the two or more measurements, by comparing the measurements, one can detect a low luminescence signal in the presence of relatively high noise levels. Various techniques are described for modulating the irradiance and detecting changes in signal.

Abstract: A luminescence measuring system is provided for detecting luminescence at extremely low concentrations of luminescing moieties. The method employs alternating radiation at a plurality of loci of an inhomogenous solution, where the radiant power is maintained constant, and the irradiated volumes of pairs of loci are systematically varied. With the probability being very low that the same luminescence signal will be obtained in the two or more measurements, by comparing the measurements, one can detect a low luminescence signal in the presence of relatively high noise levels. Various techniques are described for modulating the irradiance and detecting changes in signal.