Patents by Inventor Fu-Chang Hsu

Fu-Chang Hsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7339824
    Abstract: A combination EEPROM and Flash memory is described containing cells in which the stacked gate transistor of the Flash cell is used in conjunction with a select transistor to form an EEPROM cell. The select transistor is made sufficiently small so as to allow the EEPROM cells to accommodate the bit line pitch of the Flash cell, which facilitates combining the two memories into memory banks containing both cells. The EEPROM cells are erased by byte while the Flash cells erased by block. The small select transistor has a small channel length and width, which is compensated by increasing gate voltages on the select transistor and pre-charge bitline during CHE program operation.
    Type: Grant
    Filed: December 4, 2006
    Date of Patent: March 4, 2008
    Assignee: Aplus Flash Technology, Inc.
    Inventors: Peter W. Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma
  • Patent number: 7324384
    Abstract: A novel FLASH-based EEPROM cell, decoder, and layout scheme are disclosed to eliminate the area-consuming divided triple-well in cell array and allows byte-erase and byte-program for high P/E cycles. Furthermore, the process-compatible FLASH cell for EEPROM part can be integrated with FLASH and ROM parts so that a superior combo, monolithic, nonvolatile memory is achieved. Unlike all previous arts, the novel combo nonvolatile memory of the present invention of ROM, EEPROM and FLASH or combination of any two is made of one unified, fully compatible, highly-scalable BN+ cell and unified process. In addition, its cell operation schemes have zero array overhead and zero disturbance during P/E operations. The novel combo nonvolatile memory is designed to meet the need in those markets requiring flexible write size in units of bytes, pages and blocks at a lower cost.
    Type: Grant
    Filed: May 26, 2006
    Date of Patent: January 29, 2008
    Assignee: Aplus Flash Technology, Inc.
    Inventors: Peter W. Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma, Koucheng Wu
  • Patent number: 7289366
    Abstract: A nonvolatile memory array has a single transistor flash memory cell and a two transistor EEPROM memory cell which maybe integrated on the same substrate. The nonvolatile memory cell has a floating gate with a low coupling coefficient to permit a smaller memory cell. The floating gate placed over a tunneling insulation layer, the floating gate is aligned with edges of the source region and the drain region and having a width defined by a width of the edges of the source the drain. The floating gate and control gate have a relatively small coupling ratio of less than 50% to allow scaling of the nonvolatile memory cells. The nonvolatile memory cells are programmed with channel hot electron programming and erased with Fowler Nordheim tunneling at relatively high voltages.
    Type: Grant
    Filed: March 15, 2006
    Date of Patent: October 30, 2007
    Assignee: Aplus Flash Technology, Inc.
    Inventors: Peter W. Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma
  • Patent number: 7283401
    Abstract: A nonvolatile memory array has a single transistor flash memory cell and a two transistor EEPROM memory cell which maybe integrated on the same substrate. The nonvolatile memory cell has a floating gate with a low coupling coefficient to permit a smaller memory cell. The floating gate placed over a tunneling insulation layer, the floating gate is aligned with edges of the source region and the drain region and having a width defined by a width of the edges of the source the drain. The floating gate and control gate have a relatively small coupling ratio of less than 50% to allow scaling of the nonvolatile memory cells. The nonvolatile memory cells are programmed with channel hot electron programming and erased with Fowler Nordheim tunneling at relatively high voltages.
    Type: Grant
    Filed: March 28, 2006
    Date of Patent: October 16, 2007
    Assignee: Aplus Flash Technology, Inc.
    Inventors: Peter W. Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma
  • Publication number: 20070133341
    Abstract: A combination EEPROM and Flash memory is described containing cells in which the stacked gate transistor of the Flash cell is used in conjunction with a select transistor to form an EEPROM cell. The select transistor is made sufficiently small so as to allow the EEPROM cells to accommodate the bit line pitch of the Flash cell, which facilitates combining the two memories into memory banks containing both cells. The EEPROM cells are erased by byte while the Flash cells erased by block. The small select transistor has a small channel length and width, which is compensated by increasing gate voltages on the select transistor and pre-charge bitline during CHE program operation.
    Type: Application
    Filed: December 4, 2006
    Publication date: June 14, 2007
    Inventors: Peter Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma
  • Publication number: 20070133289
    Abstract: The device of the invention includes a plurality of isolation layers formed at predetermined regions of a semiconductor substrate and running parallel with each other. The devices of the present invention also include a high voltage PMOS placed on top of a deep N-well and NMOS placed above a triple P-well inside the deep N-well in the peripheral area to pass both positive and negative high voltage of around +20V and ?20V to the cell area. In one embodiment, the cell array, source lines and bit lines are all placed on top of the P-substrate without a deep N-well or Triple P-well. In other embodiments, the cell array, source lines and bit lines are placed on top of the deep N-well and triple P-well.
    Type: Application
    Filed: November 30, 2006
    Publication date: June 14, 2007
    Inventors: Han-Rei Ma, Fu-Chang Hsu, Peter Lee, Xiang Hong
  • Publication number: 20070076480
    Abstract: A combination EEPROM and Flash memory is described containing cells in which the stacked gate transistor of the Flash cell is used in conjunction with a select transistor to form an EEPROM cell. The select transistor is made sufficiently small so as to allow the EEPROM cells to accommodate the bit line pitch of the Flash cell, which facilitates combining the two memories into memory banks containing both cells. The EEPROM cells are erased by byte while the Flash cells erased by block. The small select transistor has a small channel length and width, which is compensated by increasing gate voltages on the select transistor and pre-charge bitline during CHE program operation.
    Type: Application
    Filed: December 4, 2006
    Publication date: April 5, 2007
    Inventors: Peter Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma
  • Publication number: 20070047302
    Abstract: A nonvolatile memory array has a single transistor flash memory cell and a two transistor EEPROM memory cell which maybe integrated on the same substrate. The nonvolatile memory cell has a floating gate with a low coupling coefficient to permit a smaller memory cell. The floating gate placed over a tunneling insulation layer, the floating gate is aligned with edges of the source region and the drain region and having a width defined by a width of the edges of the source the drain. The floating gate and control gate have a relatively small coupling ratio of less than 50% to allow scaling of the nonvolatile memory cells. The nonvolatile memory cells are programmed with channel hot electron programming and erased with Fowler Nordheim tunneling at relatively high voltages.
    Type: Application
    Filed: March 28, 2006
    Publication date: March 1, 2007
    Inventors: Peter Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma
  • Patent number: 7154783
    Abstract: A combination EEPROM and Flash memory is described containing cells in which the stacked gate transistor of the Flash cell is used in conjunction with a select transistor to form an EEPROM cell. The select transistor is made sufficiently small so as to allow the EEPROM cells to accommodate the bit line pitch of the Flash cell, which facilitates combining the two memories into memory banks containing both cells. The EEPROM cells are erased by byte while the Flash cells erased by block. The small select transistor has a small channel length and width, which is compensated by increasing gate voltages on the select transistor and pre-charge bitline during CHE program operation.
    Type: Grant
    Filed: December 14, 2004
    Date of Patent: December 26, 2006
    Assignee: APlus Flash Technology, Inc.
    Inventors: Peter W. Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma
  • Patent number: 7149120
    Abstract: A combination EEPROM and Flash memory is described containing cells in which the stacked gate transistor of the Flash cell is used in conjunction with a select transistor to form an EEPROM cell. The select transistor is made sufficiently small so as to allow the EEPROM cells to accommodate the bit line pitch of the Flash cell, which facilitates combining the two memories into memory banks containing both cells. The EEPROM cells are erased by byte while the Flash cells erased by block. The small select transistor has a small channel length and width, which is compensated by increasing gate voltages on the select transistor and pre-charge bitline during CHE program operation.
    Type: Grant
    Filed: December 14, 2004
    Date of Patent: December 12, 2006
    Assignee: Aplus Flash Technology, Inc.
    Inventors: Peter W. Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma
  • Publication number: 20060234394
    Abstract: A novel FLASH-based EEPROM cell, decoder, and layout scheme are disclosed to eliminate the area-consuming divided triple-well in cell array and allows byte-erase and byte-program for high P/E cycles. Furthermore, the process-compatible FLASH cell for EEPROM part can be integrated with FLASH and ROM parts so that a superior combo, monolithic, nonvolatile memory is achieved. Unlike all previous arts, the novel combo nonvolatile memory of the present invention of ROM, EEPROM and FLASH or combination of any two is made of one unified, fully compatible, highly-scalable BN+ cell and unified process. In addition, its cell operation schemes have zero array overhead and zero disturbance during P/E operations. The novel combo nonvolatile memory is designed to meet the need in those markets requiring flexible write size in units of bytes, pages and blocks at a lower cost.
    Type: Application
    Filed: May 26, 2006
    Publication date: October 19, 2006
    Inventors: Peter Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma, Koucheng Wu
  • Patent number: 7120064
    Abstract: A novel FLASH-based EEPROM cell, decoder, and layout scheme are disclosed to eliminate the area-consuming divided triple-well in cell array and allows byte-erase and byte-program for high P/E cycles. Furthermore, the process-compatible FLASH cell for EEPROM part can be integrated with FLASH and ROM parts so that a superior combo, monolithic, nonvolatile memory is achieved. Unlike all previous arts, the novel combo nonvolatile memory of the present invention of ROM, EEPROM and FLASH or combination of any two is made of one unified, fully compatible, highly-scalable BN+ cell and unified process. In addition, its cell operation schemes have zero array overhead and zero disturbance during P/E operations. The novel combo nonvolatile memory is designed to meet the need in those markets requiring flexible write size in units of bytes, pages and blocks at a lower cost.
    Type: Grant
    Filed: January 14, 2005
    Date of Patent: October 10, 2006
    Assignee: Aplus Flash Technology, Inc.
    Inventors: Peter W. Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma, Koucheng Wu
  • Patent number: 7110302
    Abstract: A novel FLASH-based EEPROM cell, decoder, and layout scheme are disclosed to eliminate the area-consuming divided triple-well in cell array and allows byte-erase and byte-program for high P/E cycles. Furthermore, the process-compatible FLASH cell for EEPROM part can be integrated with FLASH and ROM parts so that a superior combo, monolithic, nonvolatile memory is achieved. Unlike all previous arts, the novel combo nonvolatile memory of the present invention of ROM, EEPROM and FLASH or combination of any two is made of one unified, fully compatible, highly-scalable BN+ cell and unified process. In addition, its cell operation schemes have zero array overhead and zero disturbance during P/E operations. The novel combo nonvolatile memory is designed to meet the need in those markets requiring flexible write size in units of bytes, pages and blocks at a lower cost.
    Type: Grant
    Filed: January 14, 2005
    Date of Patent: September 19, 2006
    Assignee: Aplus Flash Technology, Inc.
    Inventors: Peter W. Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma, Koucheng Wu
  • Patent number: 7102929
    Abstract: A novel FLASH-based EEPROM cell, decoder, and layout scheme are disclosed to eliminate the area-consuming divided triple-well in cell array and allows byte-erase and byte-program for high P/E cycles. Furthermore, the process-compatible FLASH cell for EEPROM part can be integrated with FLASH and ROM parts so that a superior combo, monolithic, nonvolatile memory is achieved. Unlike all previous arts, the novel combo nonvolatile memory of the present invention of ROM, EEPROM and FLASH or combination of any two is made of one unified, fully compatible, highly-scalable BN+ cell and unified process. In addition, its cell operation schemes have zero array overhead and zero disturbance during P/E operations. The novel combo nonvolatile memory is designed to meet the need in those markets requiring flexible write size in units of bytes, pages and blocks at a lower cost.
    Type: Grant
    Filed: January 14, 2005
    Date of Patent: September 5, 2006
    Assignee: Aplus Flash Technology, Inc.
    Inventors: Peter W. Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma, Koucheng Wu
  • Publication number: 20060176738
    Abstract: A nonvolatile memory array has a single transistor flash memory cell and a two transistor EEPROM memory cell which maybe integrated on the same substrate. The nonvolatile memory cell has a floating gate with a low coupling coefficient to permit a smaller memory cell. The floating gate placed over a tunneling insulation layer, the floating gate is aligned with edges of the source region and the drain region and having a width defined by a width of the edges of the source the drain. The floating gate and control gate have a relatively small coupling ratio of less than 50% to allow scaling of the nonvolatile memory cells. The nonvolatile memory cells are programmed with channel hot electron programming and erased with Fowler Nordheim tunneling at relatively high voltages.
    Type: Application
    Filed: March 28, 2006
    Publication date: August 10, 2006
    Inventors: Peter Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma
  • Publication number: 20060176739
    Abstract: A nonvolatile memory array has a single transistor flash memory cell and a two transistor EEPROM memory cell which maybe integrated on the same substrate. The nonvolatile memory cell has a floating gate with a low coupling coefficient to permit a smaller memory cell. The floating gate placed over a tunneling insulation layer, the floating gate is aligned with edges of the source region and the drain region and having a width defined by a width of the edges of the source the drain. The floating gate and control gate have a relatively small coupling ratio of less than 50% to allow scaling of the nonvolatile memory cells. The nonvolatile memory cells are programmed with channel hot electron programming and erased with Fowler Nordheim tunneling at relatively high voltages.
    Type: Application
    Filed: March 28, 2006
    Publication date: August 10, 2006
    Inventors: Peter Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma
  • Publication number: 20060171203
    Abstract: A nonvolatile memory array has a single transistor flash memory cell and a two transistor EEPROM memory cell which maybe integrated on the same substrate. The nonvolatile memory cell has a floating gate with a low coupling coefficient to permit a smaller memory cell. The floating gate placed over a tunneling insulation layer, the floating gate is aligned with edges of the source region and the drain region and having a width defined by a width of the edges of the source the drain. The floating gate and control gate have a relatively small coupling ratio of less than 50% to allow scaling of the nonvolatile memory cells. The nonvolatile memory cells are programmed with channel hot electron programming and erased with Fowler Nordheim tunneling at relatively high voltages.
    Type: Application
    Filed: March 15, 2006
    Publication date: August 3, 2006
    Inventors: Peter Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma
  • Patent number: 7075826
    Abstract: A novel FLASH-based EEPROM cell, decoder, and layout scheme are disclosed to eliminate the area-consuming divided triple-well in cell array and allows byte-erase and byte-program for high P/E cycles. Furthermore, the process-compatible FLASH cell for EEPROM part can be integrated with FLASH and ROM parts so that a superior combo, monolithic, nonvolatile memory is achieved. Unlike all previous arts, the novel combo nonvolatile memory of the present invention of ROM, EEPROM and FLASH or combination of any two is made of one unified, fully compatible, highly-scalable BN+ cell and unified process. In addition, its cell operation schemes have zero array overhead and zero disturbance during P/E operations. The novel combo nonvolatile memory is designed to meet the need in those markets requiring flexible write size in units of bytes, pages and blocks at a lower cost.
    Type: Grant
    Filed: January 14, 2005
    Date of Patent: July 11, 2006
    Assignee: Aplus Flash Technology, Inc.
    Inventors: Peter W. Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma, Koucheng Wu
  • Patent number: 7064978
    Abstract: A nonvolatile memory array has a single transistor flash memory cell and a two transistor EEPROM memory cell which maybe integrated on the same substrate. The nonvolatile memory cell has a floating gate with a low coupling coefficient to permit a smaller memory cell. The floating gate placed over a tunneling insulation layer, the floating gate is aligned with edges of the source region and the drain region and having a width defined by a width of the edges of the source the drain. The floating gate and control gate have a relatively small coupling ratio of less than 50% to allow scaling of the nonvolatile memory cells. The nonvolatile memory cells are programmed with channel hot electron programming and erased with Fowler Nordheim tunneling at relatively high voltages.
    Type: Grant
    Filed: January 24, 2003
    Date of Patent: June 20, 2006
    Assignee: Aplus Flash Technology, Inc.
    Inventors: Peter W. Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma
  • Publication number: 20050185501
    Abstract: A combination EEPROM and Flash memory is described containing cells in which the stacked gate transistor of the Flash cell is used in conjunction with a select transistor to form an EEPROM cell. The select transistor is made sufficiently small so as to allow the EEPROM cells to accommodate the bit line pitch of the Flash cell, which facilitates combining the two memories into memory banks containing both cells. The EEPROM cells are erased by byte while the Flash cells erased by block. The small select transistor has a small channel length and width, which is compensated by increasing gate voltages on the select transistor and pre-charge bitline during CHE program operation.
    Type: Application
    Filed: December 14, 2004
    Publication date: August 25, 2005
    Inventors: Peter Lee, Fu-Chang Hsu, Hsing-Ya Tsao, Han-Rei Ma