Abstract: Preactivated and disaggregated shape-changed platelets, fixed shape-changed platelets, and a pharmaceutical composition thereof are used for treating acute and emergent inflammatory disease in a dosage of 1×106 to 1×108. SC-PLT is a disaggregated and activated platelet, the secretome from platelet activation has been deprived after SC-PLT preparation but their membrane still preserve cell adhesion molecular and integrin glycoprotein (eg. P-selectin, GP1a, and GPIIb etc.). Therefore, SC-PLTs can trap stromal vascularity inflammatory cells from inflammated and damaged place, and the stromal vascularity inflammatory cells are eliminated through the circulatory system to alleviate inflammation. The fixed shape-changed platelets are able to alleviate inflammation and sustainable for longer storage duration.

Abstract: Preactivated and disaggregated shape-changed platelets, fixed shape-changed platelets, and a pharmaceutical composition thereof are used for treating acute and emergent inflammatory disease in a dosage of 1×106 to 1×108. Activated platelets release and transfer adhesion factors to the surface of platelet cells, and trap stromal vascularity inflammatory cells from inflammated and damaged place, and the stromal vascularity inflammatory cells are eliminated through the circulatory system to alleviate inflammation. The fixed shape-changed platelets are able to alleviate inflammation and sustainable for longer storage duration.

Abstract: Preactivated and disaggregated shape-changed platelets, fixed shape-changed platelets, and a pharmaceutical composition thereof are used for treating acute and emergent inflammatory disease in a dosage of 1×106 to 1×108. Activated platelets release and transfer adhesion factors to the surface of platelet cells, and trap stromal vascularity inflammatory cells from inflammated and damaged place, and the stromal vascularity inflammatory cells are eliminated through the circulatory system to alleviate inflammation. The fixed shape-changed platelets are able to alleviate inflammation and sustainable for longer storage duration.

Abstract: An ampoule opener has an opening unit and a cover unit. The opening unit is a rigid frame and has two panels, two head-clamping holes and two pairs of wave-shaped flanges. The panels are respectively an upper panel and a lower panel. The head-clamping holes are elongated in length and tapered in width and are respectively formed through the panels. The pairs of wave-shaped flanges are formed between the panels and the head-clamping holes. The cover unit is flexible, is detachably mounted around the opening unit and has two covering boards, a mounting recess, two body-clamping holes and two pairs of wave-shaped edges. The body-clamping holes are elongated in length and tapered in width and are respectively formed through the mounting boards and communicate with the mounting recess. The pairs of wave-shaped edges are formed between the mounting boards and the body-clamping holes.

Abstract: An operating voltage tuning method for a static random access memory is disclosed. The static random access memory receives a periphery voltage and a memory cell voltage. The steps of the method mentioned above are shown as follows. First, perform a shmoo test on the static random access memory to obtain a shmoo test plot and a minimum operating voltage. Compare the minimum operating voltage with a preset specification. Position a specification position point on the line which the periphery voltage is equal to the memory cell voltage in the shmoo test plot corresponding to the preset specification. Fix one of the memory cell voltage and the periphery voltage and gradually decrease the other to test the static random access memory and obtain a failure bits distribution. Finally, tune process parameters of the static random access memory according to the specification position point and the failure bits distribution.

Abstract: An operating voltage tuning method for a static random access memory is disclosed. The static random access memory receives a periphery voltage and a memory cell voltage. The steps of the method mentioned above are shown as follows. First, perform a shmoo test on the static random access memory to obtain a shmoo test plot and a minimum operating voltage. Compare the minimum operating voltage with a preset specification. Position a specification position point on the line which the periphery voltage is equal to the memory cell voltage in the shmoo test plot corresponding to the preset specification. Fix one of the memory cell voltage and the periphery voltage and gradually decrease the other to test the static random access memory and obtain a failure bits distribution. Finally, tune process parameters of the static random access memory according to the specification position point and the failure bits distribution.