Patents by Inventor FU-YU SHIH

FU-YU SHIH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Calibration method for emulating group III-V semiconductor device and method for manufacturing group III-V semiconductor device
    Patent number: 12254262
    Abstract: A calibration method for emulating a Group III-V semiconductor device, a method for determining trap location within a Group III-V semiconductor device and method for manufacturing a Group III-V semiconductor device are provided. Actual tape-out is performed according to an actual process flow of the Group III-V semiconductor device for manufacturing the Group III-V semiconductor devices and PCM Group III-V semiconductor device. Actual electrical performances of the Group III-V semiconductor devices and the PCM Group III-V semiconductor device are obtained and the actual electrical performances of the Group III-V semiconductor devices and the PCM Group III-V semiconductor device are compared to determine locations where one or more traps appear.
    Type: Grant
    Filed: August 31, 2021
    Date of Patent: March 18, 2025
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    Inventors: Chia-Chung Chen, Shufang Fu, Kuan-Hung Liu, Chiao-Chun Hsu, Fu-Yu Shih, Chi-Feng Huang, Chu Fu Chen
  • CALIBRATION METHOD FOR EMULATING GROUP III-V SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING GROUP III-V SEMICONDUCTOR DEVICE
    Publication number: 20230066030
    Abstract: A calibration method for emulating a Group III-V semiconductor device, a method for determining trap location within a Group III-V semiconductor device and method for manufacturing a Group III-V semiconductor device are provided. Actual tape-out is performed according to an actual process flow of the Group III-V semiconductor device for manufacturing the Group III-V semiconductor devices and PCM Group III-V semiconductor device. Actual electrical performances of the Group III-V semiconductor devices and the PCM Group III-V semiconductor device are obtained and the actual electrical performances of the Group III-V semiconductor devices and the PCM Group III-V semiconductor device are compared to determine locations where one or more traps appear.
    Type: Application
    Filed: August 31, 2021
    Publication date: March 2, 2023
    Inventors: CHIA-CHUNG CHEN, SHUFANG FU, KUAN-HUNG LIU, CHIAO-CHUN HSU, FU-YU SHIH, CHI-FENG HUANG, CHU FU CHEN