Patents by Inventor Fudong Guo

Fudong Guo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for measuring point diffraction interferometric wavefront aberration and method for detecting wave aberration
    Patent number: 9658114
    Abstract: A device for measuring point diffraction interferometric wavefront aberration having an optical source, an optical splitter, a first light intensity and polarization regulator, a phase shifter, a second light intensity and polarization regulator, an ideal wavefront generator, an object precision adjusting stage, a measured optical system, an image wavefront detection unit, an image precision adjusting stage, and a data processing unit. A method for detecting wavefront aberration of the optical system by using the device is also disclosed.
    Type: Grant
    Filed: December 31, 2015
    Date of Patent: May 23, 2017
    Assignee: Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
    Inventors: Feng Tang, Xiangzhao Wang, Peng Feng, Fudong Guo, Yunjun Lu