Abstract: Optical unit for a projective optical metrological system, which receives a light signal coming from a light constellation comprising a number of light sources; the optical unit includes: an optoelectronic image acquisition system and a first and a second optical circuit, which receive the light signal and are traversed by a first and a second optical beam, respectively. The first and the second optical circuits direct, respectively, at least a first part of the first optical beam and at least a first part of the second optical beam on the optoelectronic image acquisition system, so as to cause the simultaneous formation of two different images of the constellation in the optoelectronic image acquisition system. The optical unit further includes an electronic processing unit coupled to the optoelectronic image acquisition system, which determines a number of quantities indicative of the position and/or attitude of the light constellation with respect to the optical unit, based on the two images.

Abstract: Optical unit for a projective optical metrological system, which receives a light signal coming from a light constellation comprising a number of light sources; the optical unit includes: an optoelectronic image acquisition system and a first and a second optical circuit, which receive the light signal and are traversed by a first and a second optical beam, respectively. The first and the second optical circuits direct, respectively, at least a first part of the first optical beam and at least a first part of the second optical beam on the optoelectronic image acquisition system, so as to cause the simultaneous formation of two different images of the constellation in the optoelectronic image acquisition system. The optical unit further includes an electronic processing unit coupled to the optoelectronic image acquisition system, which determines a number of quantities indicative of the position and/or attitude of the light constellation with respect to the optical unit, based on the two images.

Abstract: An optical flow odometer to determine the position of an object movable relatively to a surface is provided that includes a cluster of digital image sensors intended to be arranged on the movable object at respective reference positions and an electronic processing and control unit electrically connected with the digital image sensors and configured to: operate the digital image sensors in subsequent time instants during movement of the movable object so as to carry out a sequence of multiple digital image capture operations, in each of which the digital image sensors are operated to simultaneously capture respective digital images, and receive from the digital image sensors and process the digital images captured in the multiple digital image capture operations to compute either the positions of the individual digital image sensors or the position of the cluster of digital image sensors at one or more of the multiple digital image capture operations, and compute the position of the movable object at one or m

Abstract: A projective optical metrology system including a first optical unit, which includes: an optical input that receives a first light signal; a number of optical paths; and a separator, which is optically interposed between the optical input and the optical paths and separates a number of components of the first light signal received by the optical input and couples each of the separate components to a corresponding optical path. The first optical unit also includes a light target, which emits a second light signal and is formed by a number of light elements, each light element being optically coupled to a corresponding optical path, so as to be illuminated, in use, by the component of the first light signal coupled to the corresponding optical path. The metrology system also includes a second optical unit, which generates the first light signal and receives the second light signal.

Abstract: A projective optical metrology system including a first optical unit, which includes: an optical input that receives a first light signal; a number of optical paths; and a separator, which is optically interposed between the optical input and the optical paths and separates a number of components of the first light signal received by the optical input and couples each of the separate components to a corresponding optical path. The first optical unit also includes a light target, which emits a second light signal and is formed by a number of light elements, each light element being optically coupled to a corresponding optical path, so as to be illuminated, in use, by the component of the first light signal coupled to the corresponding optical path. The metrology system also includes a second optical unit, which generates the first light signal and receives the second light signal.

Abstract: Described herein is a projective optical metrology system including: a light target formed by a first number of light sources having a pre-set spatial arrangement; and an optical unit including an optoelectronic image sensor, which receives a light signal coming from the light target and defines two different optical paths for the light signal towards the optoelectronic image sensor. The two optical paths are such that the light signal forms on the optoelectronic image sensor at most an image of the light target that can be processed for determining at least one quantity indicating the mutual arrangement between the light target and the optical unit.

Abstract: Described herein is a projective optical metrology system including: a light target equipped with a plurality of light sources having a pre-set spatial arrangement; an optoelectronic image sensor; an optical unit receiving a light signal coming from the light target and defining two different optical paths for the light signal towards the optoelectronic image sensor, the two optical paths being such as to cause simultaneous formation on the optoelectronic image sensor of at least two images of the light target; and an electronic processing unit coupled to the optoelectronic image sensor and determining a plurality of different quantities indicating the position and attitude of the light target with respect to the optical unit, on the basis of the two images.

Abstract: A projective optical metrology system including a first optical unit, which includes: an optical input that receives a first light signal; a number of optical paths; and a separator, which is optically interposed between the optical input and the optical paths and separates a number of components of the first light signal received by the optical input and couples each of the separate components to a corresponding optical path. The first optical unit also includes a light target, which emits a second light signal and is formed by a number of light elements, each light element being optically coupled to a corresponding optical path, so as to be illuminated, in use, by the component of the first light signal coupled to the corresponding optical path. The metrology system also includes a second optical unit, which generates the first light signal and receives the second light signal.

Abstract: Described herein is a projective optical metrology system including: a light target formed by a first number of light sources having a pre-set spatial arrangement; and an optical unit including an optoelectronic image sensor, which receives a light signal coming from the light target and defines two different optical paths for the light signal towards the optoelectronic image sensor. The two optical paths are such that the light signal forms on the optoelectronic image sensor at most an image of the light target that can be processed for determining at least one quantity indicating the mutual arrangement between the light target and the optical unit.

Abstract: Described herein is a projective optical metrology system including: a light target equipped with a plurality of light sources having a pre-set spatial arrangement; an optoelectronic image sensor; an optical unit receiving a light signal coming from the light target and defining two different optical paths for the light signal towards the optoelectronic image sensor, the two optical paths being such as to cause simultaneous formation on the optoelectronic image sensor of at least two images of the light target; and an electronic processing unit coupled to the optoelectronic image sensor and determining a plurality of different quantities indicating the position and attitude of the light target with respect to the optical unit, on the basis of the two images.

Abstract: Periscopic lighting system comprising at least one light source placed in the lower part of the system and at least two optical functions that form as a whole an optical guidance coupled to the source.