Abstract: Provided are an image classification device and method that are capable of extracting and mapping an important feature in an image. The image classification device includes: a feature extraction unit 101 that generates a first image group generated by applying different noises to the same image among images included in an image group and a second image group including different images, is trained such that features obtained from the first image group are approximate, is trained such that features obtained from the second image group are more different, and extracts features; a feature mapping unit 102 that maps the extracted plurality of features two-dimensionally or three-dimensionally using manifold learning; and a display unit 103 that displays a mapping result and constructs a training information application task screen.

Abstract: The purpose of the present invention is to provide an image evaluation device and method which can detect unknown defects and which can prevent misrecognition by a machine learning model. This image evaluation device, which uses a machine learning classifier to classify defect information in a defect image of an electronic device, is characterized by being provided with: an image storage unit which stores a defect image of an electronic device; a defect region storage unit which stores defect region information that is in the defect image; a classifier which classifies the defect information with machine learning; an image extraction unit which, in the course of the defect image classification processing, extracts image-of-interest information which the classifier will focus on; and an evaluation unit which compares the image-of-interest information and the defect region information to evaluate the classifiability of the defect image.

Abstract: The objective of the present invention is to provide an image classification device and a method therefor with which suitable teaching data can be created. An image classification device that carries out image classification using images which are in a class to be classified and include teaching information, and images which are in a class not to be classified and to which teaching information has not been assigned, said image classification device being characterized by being provided with: an image group input unit for receiving inputs of an image group belonging to a class to be classified and an image group belonging to a class not to be classified; and a subclassification unit for extracting a feature amount for each image in an image group, clustering the feature amounts of the images in the image group belonging to a class not to be classified, and thereby dividing the images into sub-classes.

Abstract: The purpose of the present invention is to provide an image evaluation device and method which can detect unknown defects and which can prevent misrecognition by a machine learning model. This image evaluation device, which uses a machine learning classifier to classify defect information in a defect image of an electronic device, is characterized by being provided with: an image storage unit which stores a defect image of an electronic device; a defect region storage unit which stores defect region information that is in the defect image; a classifier which classifies the defect information with machine learning; an image extraction unit which, in the course of the defect image classification processing, extracts image-of-interest information which the classifier will focus on; and an evaluation unit which compares the image-of-interest information and the defect region information to evaluate the classifiability of the defect image.

Abstract: A plurality of projections, respectively given later as cores of a plurality of external connection terminals, are formed first by selectively forming a curable resin layer over a protective insulating film; flat portions are then formed respectively on the top surfaces of the plurality of projections, by pressing a molding jig having a flat opposing surface onto the top surfaces of the plurality of projections, before the projections are cured; the plurality of projections are cured; and the plurality of external connection terminals, and the plurality of interconnects are formed, by selectively forming an electro-conductive film over the plurality of projections, the protective insulating film, and the plurality of electrode pads.

Abstract: A semiconductor device includes a protective insulating film, an opening formed in the protective insulating film, an electrode pad located within the opening, a bump formed on the protective insulating film, and an interconnect. The bump includes a bump core and a conductive film. The bump core includes an insulating resin layer and a conductive resin layer located on the insulating resin layer. The conductive film is formed on at least the upper surface of the bump core. The interconnect connects the conductive film of the bump and the electrode pad.

Abstract: A layer to be etched is first formed in a substrate. Then, a mask pattern is formed over the layer to be etched. Then, the layer to be etched is wet-etched using the mask pattern as a mask. In the procedure of performing wet etching, the substrate is dipped into an etching bath with the mask pattern downward.

Abstract: A method for manufacturing a semiconductor device includes forming an electrode pad in a surface layer of an insulating layer; disposing a conductive particle, of which at least a portion of the surface is coated with a thermoplastic resin, over the electrode pad; and fixing the conductive particle over the electrode pad using the resin, by heating the resin to soften the resin, and then cooling and solidifying the resin after the conductive particle and the electrode pad are electrically connected to each other, to form the conductive particle as an external connection terminal.

Abstract: A method for manufacturing a semiconductor device includes forming an electrode pad in a surface layer of an insulating layer; disposing a conductive particle, of which at least a portion of the surface is coated with a thermoplastic resin, over the electrode pad; and fixing the conductive particle over the electrode pad using the resin, by heating the resin to soften the resin, and then cooling and solidifying the resin after the conductive particle and the electrode pad are electrically connected to each other, to form the conductive particle as an external connection terminal.

Abstract: A semiconductor device includes an electrode pad and a protective insulating film having an opening to expose the electrode pad. The semiconductor device further includes a bump (resin core bump) that includes a bump core (resin core) formed on the protective insulating film and a conductive layer formed on the bump core. The semiconductor device further includes an interconnect that connects the conductive layer and the electrode pad. The bump core is in the form of a laminate of plural resin layers (for example, first and second resin layers) that have different elastic modulus.

Abstract: A semiconductor device includes a protective insulating film, an opening formed in the protective insulating film, an electrode pad located within the opening, a bump formed on the protective insulating film, and an interconnect. The bump includes a bump core and a conductive film. The bump core includes an insulating resin layer and a conductive resin layer located on the insulating resin layer. The conductive film is formed on at least the upper surface of the bump core. The interconnect connects the conductive film of the bump and the electrode pad.

Abstract: A photosensitive resin film is formed on a protective insulating film. Next, a plurality of bump cores is formed on the protective insulating film along a first straight line by exposing and developing the photosensitive resin film. Next, a plurality of bumps, and a plurality of interconnects that connects each of the plurality of bumps to any of the electrode pads are formed by selectively forming conductive films on a plurality of bump cores, a plurality of electrode pads, and the protective insulating film. In the step of forming a plurality of bump cores, a region bordering on the interconnect on the lateral faces of the bump core is formed to have a gentler slope than that of a region intersecting the first straight line, by exposing the photosensitive resin film only one time using a multi-gradation mask.

Abstract: A layer to be etched is first formed in a substrate. Then, a mask pattern is formed over the layer to be etched. Then, the layer to be etched is wet-etched using the mask pattern as a mask. In the procedure of performing wet etching, the substrate is dipped into an etching bath with the mask pattern downward.

Abstract: A plurality of projections, respectively given later as cores of a plurality of external connection terminals, are formed first by selectively forming a curable resin layer over a protective insulating film; flat portions are then formed respectively on the top surfaces of the plurality of projections, by pressing a molding jig having a flat opposing surface onto the top surfaces of the plurality of projections, before the projections are cured; the plurality of projections are cured; and the plurality of external connection terminals, and the plurality of interconnects are formed, by selectively forming an electro-conductive film over the plurality of projections, the protective insulating film, and the plurality of electrode pads.