Patents by Inventor Fumihiro Mizutani

Fumihiro Mizutani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for centering a log
    Patent number: 7422042
    Abstract: An apparatus for centering a log to allow an optimum yield axis and a maximum radius of rotation of the log to be calculated more accurately than conventionally possible. The angle of rotation of a log M is detected by a rotation angle detector that is engaged with a preliminary axis c about which the log M is rotated. A contour of the log for calculating the optimum yield axis of the log and a contour for calculating the maximum radius of rotation of the log are measured separately. The contour for calculating the optimum yield axis is measured in a fixed-point manner by measuring the log at a plurality of certain measurement points with beam reflection scanners. The contour for calculating the maximum radius of rotation is measured in a comprehensive manner using swing-angle detectors engaged with contact-swinging detection members provided individually in the plural measurement sections.
    Type: Grant
    Filed: April 20, 2004
    Date of Patent: September 9, 2008
    Assignee: Meinan Machinery Works, Inc.
    Inventors: Nobuyuki Moriyama, Kazuhito Mawatari, Fumihiro Mizutani, Yukinobu Kuno, Katsuya Matsumoto, Masaru Koike
  • Method and apparatus for centering a log
    Publication number: 20040211490
    Abstract: A method and apparatus for centering a log allow a optimum yield axis and a maximum radius of rotation of the log to be calculated more accurately than conventionally possible. The angle of rotation of a log M is detected by a rotation angle detector 6 that is engaged with a preliminary axis c about which the log M is rotated. A contour of the log for calculating the optimum yield axis of the log and a contour for calculating the maximum radius of rotation of the log are measured separately. The contour for calculating the optimum yield axis is measured in a fixed-point manner by measuring the log at a plurality of certain measurement points with beam reflection scanners 8 disposed at appropriate intervals along the axis of the log M.
    Type: Application
    Filed: April 20, 2004
    Publication date: October 28, 2004
    Applicant: Meinan Machinery Works, Inc.
    Inventors: Nobuyuki Moriyama, Kazuhito Mawatari, Fumihiro Mizutani, Yukinobu Kuno, Katsuya Matsumoto, Masaru Koike