Abstract: In order to provided algorithm for searching graphs and a device for searching graph into which a new concept for solving a disadvantage arisen by using proof numbers or disproof numbers in an AND/OR graph construction is taken, algorithm according to the present invention which searches directed graphs in which OR nodes having at least one choice or more choices desired to reach to solution and AND nodes necessary to reach all choices to the solution are appeared alternately from a starting point to the solution, further comprising: a calculating step for calculating branch numbers of routes except for a specific route reaching at least from the starting point to an optional node at a specific node in the AND nodes or the OR nodes accompanying with said specific route.

Abstract: A semiconductor wafer has a device zone and a peripheral edge zone. Semiconductor devices to be screened are formed in a matrix form on the device zone of the semiconductor wafer. A plurality of wires connected to the semiconductor devices are formed on the device and peripheral edge zones. In the device zone, the wires are formed among lines of the semiconductor devices. A burn-in apparatus comprises a holder, a thermal controller, a signal generator, and interconnection members. The holder holds a plurality of the semiconductor wafers in order to install them in a room. The thermal controller controls temperature in the room to heat the semiconductor wafers up to a predetermined temperature. The signal generator generates a test pattern signal for screening the semiconductor devices. Each of the interconnection members has a plurality of electrodes formed so as to contact the ends of the wires, and presses the electrodes into the wires to establish complete connection between the electrodes and the wires.

Abstract: A semiconductor wafer has a device zone and a peripheral edge zone. Semiconductor devices to be screened are formed in a matrix form on the device zone of the semiconductor wafer. A plurality of wires connected to the semiconductor devices are formed on the device and peripheral edge zones. In the device zone, the wires are formed among lines of the semiconductor devices. A burn-in apparatus includes a holder, a thermal controller, a signal generator, and interconnection members. The holder holds a plurality of the semiconductor wafers in order to install them in a room. The thermal controller controls temperature in the room to heat the semiconductor wafers up to a predetermined temperature. The signal generator generates a test pattern signal for screening the semiconductor devices. Each of the interconnection members has a plurality of electrodes formed so as to contact the ends of the wires, and presses the electrodes into the wires to establish complete connection between the electrodes and the wires.