Patents by Inventor Fumio Inui

Fumio Inui has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical characteristic measuring apparatus, the method thereof and recording medium
    Patent number: 6678041
    Abstract: An apparatus capable of reducing a waveform distortion of outgoing light when light of an optical wavelength in a certain specific narrow range is incident upon optical fiber comprises optical source 10 for supplying the incident light to optical fiber line 110, waveform monitor 42 for measuring a waveform distortion of the transmitted light and adjusting unit 44 for adjusting an output of the incident light so that the measured waveform distortion falls within a predetermined range. By adjusting the output of the incident light, a S/N ration is lowered. Since the noise exists within a relatively wide range of wavelength, the rang of wavelength of the incident light is widened. Therefore, it is possible to reduce the waveform distortion of the outgoing light.
    Type: Grant
    Filed: June 1, 2001
    Date of Patent: January 13, 2004
    Assignee: Advantest Corporation
    Inventors: Eiji Kimura, Motoki Imamura, Fumio Inui
  • Optical characteristic measuring apparatus, the method thereof and recording medium
    Publication number: 20020003621
    Abstract: There is provided an apparatus capable of reducing a waveform distortion of an outgoing light when the light of an optical wavelength in a certain specific narrow range is incident upon an optical fiber.
    Type: Application
    Filed: June 1, 2001
    Publication date: January 10, 2002
    Applicant: ADVANTEST Corporation
    Inventors: Eiji Kimura, Motoki Imamura, Fumio Inui