Patents by Inventor Fumio TOKUTAKE

Fumio TOKUTAKE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9831828
    Abstract: A solar cell testing apparatus is provided that tests bypass diodes in a solar cell string constructed by connecting a plurality of solar cell modules, which include solar cells and the bypass diodes, in series for failures in the open position. The solar cell testing apparatus includes a unidirectional element that is connected between a positive electrode and a negative electrode of the solar cell string, and a voltage applier that applies a test voltage across the positive electrode and the negative electrode of the solar cell string to which the unidirectional element is connected. The solar cell testing apparatus also includes a current detector that detects a current flowing in the solar cell string, and a processor that executes processes that measure a current value of a shorted current of a solar cell string and tests for failures.
    Type: Grant
    Filed: August 7, 2017
    Date of Patent: November 28, 2017
    Assignee: HIOKI DENKI KABUSHIKI KAISHA
    Inventors: Masao Higuchi, Fumio Tokutake
  • Publication number: 20170338770
    Abstract: A solar cell testing apparatus is provided that tests bypass diodes in a solar cell string constructed by connecting a plurality of solar cell modules, which include solar cells and the bypass diodes, in series for failures in the open position. The solar cell testing apparatus includes a unidirectional element that is connected between a positive electrode and a negative electrode of the solar cell string, and a voltage applier that applies a test voltage across the positive electrode and the negative electrode of the solar cell string to which the unidirectional element is connected. The solar cell testing apparatus also includes a current detector that detects a current flowing in the solar cell string, and a processor that executes processes that measure a current value of a shorted current of a solar cell string and tests for failures.
    Type: Application
    Filed: August 7, 2017
    Publication date: November 23, 2017
    Applicant: HIOKI DENKI KABUSHIKI KAISHA
    Inventors: Masao HIGUCHI, Fumio TOKUTAKE
  • Patent number: 9762179
    Abstract: A solar cell testing apparatus tests bypass diodes in a solar cell string, which is constructed of solar cell modules including solar cells and the bypass diodes, for open-position failures and includes: a unidirectional element connected between positive and negative electrodes of the solar cell string so as to permit passage of the current outputted when the solar cells generate power; a voltage applier that apples a test voltage, which exceeds a sum of forward direction voltages of the bypass diodes and sets the negative electrode potential higher than the positive electrode potential, across the positive and negative electrodes; a current detector that detects a current flowing in the solar cell string; and a processor that tests for open-position failures by comparing currents detected before and after application of the test voltage with the unidirectional element connected between the electrodes of the solar cell string.
    Type: Grant
    Filed: April 27, 2016
    Date of Patent: September 12, 2017
    Assignee: HIOKI DENKI KABUSHIKI KAISHA
    Inventors: Masao Higuchi, Fumio Tokutake
  • Publication number: 20160329863
    Abstract: A solar cell testing apparatus tests bypass diodes in a solar cell string, which is constructed of solar cell modules including solar cells and the bypass diodes, for open-position failures and includes: a unidirectional element connected between positive and negative electrodes of the solar cell string so as to permit passage of the current outputted when the solar cells generate power; a voltage applier that apples a test voltage, which exceeds a sum of forward direction voltages of the bypass diodes and sets the negative electrode potential higher than the positive electrode potential, across the positive and negative electrodes; a current detector that detects a current flowing in the solar cell string; and a processor that tests for open-position failures by comparing currents detected before and after application of the test voltage with the unidirectional element connected between the electrodes of the solar cell string.
    Type: Application
    Filed: April 27, 2016
    Publication date: November 10, 2016
    Applicant: HIOKI DENKI KABUSHIKI KAISHA
    Inventors: Masao HIGUCHI, Fumio TOKUTAKE