Patents by Inventor Fumiya NEHASHI

Fumiya NEHASHI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220196691
    Abstract: An automatic analyzer for making measurements for different analysis processes by a compact mechanism. The apparatus performs inspection for plural different analysis processes and includes: an incubator for holding plural reaction vessels on circumferential positions, first and second dispensing mechanisms each having a dispensing nozzle capable of arc-shaped movement around a rotational axis and vertical movement, in which a first locus of an arc-shaped movement of the dispensing nozzle of the first dispensing mechanism and a second locus of the arc-shaped movement of the dispensing nozzle of the second dispensing mechanism intersect the circumference of the incubator where the reaction vessels are arranged, while the first locus and the second locus do not intersect, the first dispensing mechanism is used in a first inspection having a first reaction period, and the second dispensing mechanism is used in a second inspection having a second reaction period longer than the first reaction period.
    Type: Application
    Filed: February 5, 2020
    Publication date: June 23, 2022
    Inventors: Eiichiro Takada, Yoshihiro Yamashita, Hidetsugu Tanoue, Masashi Fukaya, Fumiya Nehashi
  • Patent number: 10962559
    Abstract: Maintenance time for an automated analysis device is reduced by executing a plurality of maintenance items in parallel. An automated analysis system 10 is provided with an automated analysis device 11 and a terminal device 38. The automated analysis system 11 measures a sample. The terminal device 38 includes a display unit 32, an operation unit 32, and a control unit provided in a computer 30. The display unit 32 displays maintenance items for maintaining the automated analysis device 11. The operation unit 31 selects one or more of the maintenance items displayed on the display unit 32. The control unit controls the automated analysis device 11 to execute in parallel all the maintenance items selected by the operation unit 31.
    Type: Grant
    Filed: March 29, 2019
    Date of Patent: March 30, 2021
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Fumiya Nehashi, Toshiharu Suzuki
  • Publication number: 20200278365
    Abstract: Maintenance time for an automated analysis device is reduced by executing a plurality of maintenance items in parallel. An automated analysis system 10 is provided with an automated analysis device 11 and a terminal device 38. The automated analysis system 11 measures a sample. The terminal device 38 includes a display unit 32, an operation unit 32, and a control unit provided in a computer 30. The display unit 32 displays maintenance items for maintaining the automated analysis device 11. The operation unit 31 selects one or more of the maintenance items displayed on the display unit 32. The control unit controls the automated analysis device 11 to execute in parallel all the maintenance items selected by the operation unit 31.
    Type: Application
    Filed: March 29, 2019
    Publication date: September 3, 2020
    Inventors: Fumiya NEHASHI, Toshiharu SUZUKI