Abstract: A light emitting apparatus includes: a light emitting element configured to emit laser light; a case configured to house the light emitting element, and including a window configured to allow transmittance of the laser light emitted from the light emitting element; a first optical element provided outside the case and configured to converge, in a fast axis direction, the laser light passing through the window; and a second optical element configured to collimate the laser light input via the first optical element, in the fast axis direction, in a state where a beam width in the fast axis direction is narrower than a beam width in the fast axis direction on an incident surface of the first optical element, the second optical element being located closer to the first optical element than a convergence point of the laser light in the fast axis direction by the first optical element.

Abstract: An optical microscope system for reconstructing an image of an object includes a means for creating a light beam profile, an optics for directing the light beam profile to the object, a moving means for implementing a scanning of the object with the light beam profile, a rotating means for enabling rotating the light beam profile and the object, and for changing the direction of scanning, and a detector for measuring the intensity of light passing through or reflected by the object. The image may be tomographically reconstructed using this intensity data associated with various directions as a plurality of projections.

Abstract: The invention is an optical microscope system (1) for reconstructing an image of an object (14), comprising: a means (8) for creating a light beam profile (7), an optics for directing the light beam profile (7) to the object (14), a moving means for implementing a scanning of the object (14) with the light beam profile (7), a rotating means for enabling rotating vis-a-vis each other the light beam profile (7) and the object (14), and for changing the direction of scanning, and a detector (5) for measuring the intensity of light passing through or reflected by the object (14). Further, the invention is a method for reconstructing the image of an object (14) by means of an optical microscope system (1).