Patents by Inventor G. David Bacher

G. David Bacher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Enhanced non-steady-state photo-induced electromotive force detector
    Patent number: 6342721
    Abstract: A photo-EMF detector for the collection of photons includes a substrate formed of a photorefractive semiconductor and a plurality of interlaced electrode pairs disposed over the substrate. Each electrode pair includes two parallel electrodes defining an active area therebetween for the collection of photons. One electrode of each pair is disposed between an adjacent pair of electrodes and proximate one electrode of the adjacent pair, light from striking a substrate surface between proximate electrodes and outputs from each of the plurality of interlaced electrode pairs are collected.
    Type: Grant
    Filed: June 10, 1999
    Date of Patent: January 29, 2002
    Assignee: Hughes Electronics Corporation
    Inventors: David Douglas Nolte, John Anthony Coy, Marvin B. Klein, G. David Bacher, Meng P. Chiao, Gilmore Joseph Dunning, Kenneth Bacher, David M. Pepper
  • HOMODYNE INTERFEROMETER USING PHOTOREFRACTIVE POLYMER COMPOSITE AND METHOD OF SENSING MATERIAL
    Publication number: 20010015809
    Abstract: Faults, dimensions and other characteristics of a material or structure are sensed by a coherent beam's reflection from the material during ultrasonic or very fast vibration. The reflected beam acquires a phase substantially different from its original phase and from the phase of a reference beam split from the common source beam. The reflected beam and the reference beam are superimposed by diffraction in a photorefractive polymer composite adaptive holographic beamsplitter, and the superimposed beams are detected by a photodetector capable of detecting small interference changes from ultrasonic surface displacements or perturbations. An apparatus and method defining an improved homodyne interferometer for performing the method is described.
    Type: Application
    Filed: March 12, 1999
    Publication date: August 23, 2001
    Inventors: MARVIN B. KLEIN, G. DAVID BACHER, DANIEL WRIGHT, W. E. MOERNER, ANDERS GRUNNET-JEPSEN
  • Homodyne interferometer and method of sensing material
    Patent number: 5900935
    Abstract: Faults, dimensions and other characteristics of a material or structure are sensed by a coherent beam's reflection from the material during ultrasonic or very fast vibration. The reflected beam acquires a phase substantially different from its original phase and from the phase of a reference beam split from the common source beam. The reflected beam and the reference beam are superimposed by diffraction in a multiple quantum well adaptive holographic beamsplitter, and the superimposed beams are detected by a photodetector capable of detecting small interference changes from ultrasonic surface displacements or perturbations. An apparatus and method defining an improved homodyne interferometer for performing the method is described.
    Type: Grant
    Filed: December 22, 1997
    Date of Patent: May 4, 1999
    Inventors: Marvin B. Klein, G. David Bacher, David D. Nolte, Indrajit Lahiri