Patents by Inventor G. Martinez Lopez

G. Martinez Lopez has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Energy filter and electron microscope
    Patent number: 6960763
    Abstract: An energy filter with reduced aberration. The energy filter has a first stage of filter for receiving an electron beam entering along the optical axis and for focusing the beam in one direction vertical to the optical axis and a second stage of filter positioned along the optical axis behind the first stage of filter. The beam once focused by the first stage of filter is made to enter the second stage of filter. In the second stage of filter, the orbit of the electron beam is inverted with respect to the focal point. The two stages of filters are identical in length taken along the optical axis. The first and second stages of filters have electric and magnetic quadrupole fields, respectively, along the optical axis. These quadrupole fields make an angle of 45 degrees to the optical axis to achieve astigmatic focusing.
    Type: Grant
    Filed: December 17, 2003
    Date of Patent: November 1, 2005
    Assignee: JEOL Ltd.
    Inventors: G. Martinez Lopez, Katsushige Tsuno
  • Wien filter and electron microscope using same
    Patent number: 6844548
    Abstract: A Wien filter is provided in which a less amount of secondary aberration is produced than conventional. This filter has 12 poles. These poles have front ends facing the optical axis. These front ends have a 12-fold rotational symmetry about the optical axis within the XY-plane perpendicular to the optical axis.
    Type: Grant
    Filed: February 7, 2003
    Date of Patent: January 18, 2005
    Assignee: Jeol Ltd.
    Inventors: G. Martinez Lopez, Katsushige Tsuno
  • Energy filter and electron microscope
    Publication number: 20040144920
    Abstract: An energy filter with reduced aberration. The energy filter has a first stage of filter for receiving an electron beam entering along the optical axis and for focusing the beam in one direction vertical to the optical axis and a second stage of filter positioned along the optical axis behind the first stage of filter. The beam once focused by the first stage of filter is made to enter the second stage of filter. In the second stage of filter, the orbit of the electron beam is inverted with respect to the focal point. The two stages of filters are identical in length taken along the optical axis. The first and second stages of filters have electric and magnetic quadrupole fields, respectively, along the optical axis. These quadrupole fields make an angle of 45 degrees to the optical axis to achieve astigmatic focusing.
    Type: Application
    Filed: December 17, 2003
    Publication date: July 29, 2004
    Applicant: JEOL Ltd.
    Inventors: G. Martinez Lopez, Katsushige Tsuno
  • Wien filter and electron microscope using same
    Publication number: 20030226975
    Abstract: A Wien filter is provided in which a less amount of secondary aberration is produced than conventional. This filter has 12 poles. These poles have front ends facing the optical axis. These front ends have a 12-fold rotational symmetry about the optical axis within the XY-plane perpendicular to the optical axis.
    Type: Application
    Filed: February 7, 2003
    Publication date: December 11, 2003
    Applicant: JEOL Ltd.
    Inventors: G. Martinez Lopez, Katsushige Tsuno