Abstract: An apparatus for capturing at least partially reflective surfaces includes a detection surface assembly, an illumination device configured to emit an illumination pattern toward the at least partially reflective surface so as so project, by reflection via the at least partially reflective surface, a first reflection pattern and a second reflection pattern onto the detection surface assembly. The apparatus includes a capturing unit configured to capture the first reflection pattern and the second reflection pattern from the detection surface assembly.

Abstract: In a light-slit method, a first and a second measurement light projection on a surface of an object to be measured may be unambiguously identified as a first or a second measurement light projection by a camera when there is a support apparatus operating the camera and/or the measurement light projectors such that, in each light-slit recording of the camera, either the first or the second measurement light projection is visible to the camera. The possibility of unambiguous identification allows evaluating several spatially overlapping and not exactly aligned measurement light projections by means of a camera.

Abstract: In a light-slit method, a first and a second measurement light projection on a surface of an object to be measured may be unambiguously identified as a first or a second measurement light projection by a camera when there is a support apparatus operating the camera and/or the measurement light projectors such that, in each light-slit recording of the camera, either the first or the second measurement light projection is visible to the camera. The possibility of unambiguous identification allows evaluating several spatially overlapping and not exactly aligned measurement light projections by means of a camera.

Abstract: In a method for characterizing a surface comprising a localized unevenness, a contour line of the surface is initially created as a function of a location variable. Subsequently, the localized unevenness is detected in the contour line and eliminated from the contour line, so that an incomplete contour line results as a function of the location variable, which characterizes the surface without the localized unevenness. The incomplete contour line may be used to either be able to evaluate the surface without any localized points of unevenness, for example to determine the side wobble or height wobble of a tire, if the surface is a side flank and/or a running tread of a vehicle tire, or to classify the localized points of unevenness without any influence of the surface.

Abstract: In a method for characterizing a surface comprising a localized unevenness, a contour line of the surface is initially created as a function of a location variable (10). Subsequently, the localized unevenness is detected in the contour line (12) and eliminated from the contour line (14), so that an incomplete contour line results as a function of the location variable, which characterizes the surface without the localized unevenness. The incomplete contour line may be used to either be able to evaluate the surface without any localized points of unevenness, for example to determine the side wobble or height wobble of a tire, if the surface is a side flank and/or a running tread of a vehicle tire, or to classify the localized points of unevenness without any influence of the surface.

Abstract: In a method for imaging in digital dental radioscopy making use of a sensor array, the individual image elements of which are smaller than a desired local resolution so that a plurality of image elements forms a respective effective image element, first reference signals, which are generated by the image elements of the sensor array when said sensor array is not exposed to X-radiation, are initially detected. In addition, second reference signals, which are generated by the image elements of the sensor array when said sensor array is exposed to X-radiation, are detected. Subsequently, defective image elements are determined on the basis of the detected first and second reference signals, whereupon an image of an object is produced using exclusively the image elements that have been determined as being non-defective.