Patents by Inventor G. William Banke, Jr.

G. William Banke, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Assessment and optimization for metrology instrument
    Patent number: 7688456
    Abstract: Methods and related program product for assessing and optimizing metrology instruments by determining a total measurement uncertainty (TMU) based on precision and accuracy. The TMU is calculated based on a linear regression analysis and removing a reference measuring system uncertainty (URMS) from a net residual error. The TMU provides an objective and more accurate representation of whether a measurement system under test has an ability to sense true product variation.
    Type: Grant
    Filed: January 29, 2008
    Date of Patent: March 30, 2010
    Assignee: International Business Machines Corporation
    Inventors: Charles N. Archie, G. William Banke, Jr.
  • Assessment and optimization for metrology instrument including uncertainty of total measurement uncertainty
    Patent number: 7453583
    Abstract: Methods and related program product for assessing and optimizing metrology instruments by determining a total measurement uncertainty (TMU) based on precision and accuracy. The TMU is calculated based on a linear regression analysis and removing a reference measuring system uncertainty (URMS) from a net residual error. The TMU provides an objective and more accurate representation of whether a measurement system under test has an ability to sense true product variation. The invention also includes a method for determining an uncertainty of the TMU.
    Type: Grant
    Filed: October 3, 2007
    Date of Patent: November 18, 2008
    Assignee: International Business Machines Corporation
    Inventors: Charles N. Archie, G. William Banke, Jr., Matthew J. Sendelbach
  • Assessment and optimization for metrology instrument
    Patent number: 7352478
    Abstract: Methods and related program product for assessing and optimizing metrology instruments by determining a total measurement uncertainty (TMU) based on precision and accuracy. The TMU is calculated based on a linear regression analysis and removing a reference measuring system uncertainty (URMS) from a net residual error. The TMU provides an objective and more accurate representation of whether a measurement system under test has an ability to sense true product variation.
    Type: Grant
    Filed: December 20, 2002
    Date of Patent: April 1, 2008
    Assignee: International Business Machines Corporation
    Inventors: Charles N. Archie, G. William Banke, Jr.
  • Assessment and optimization for metrology instrument including uncertainty of total measurement uncertainty
    Patent number: 7286247
    Abstract: Methods and related program product for assessing and optimizing metrology instruments by determining a total measurement uncertainty (TMU) based on precision and accuracy. The TMU is calculated based on a linear regression analysis and removing a reference measuring system uncertainty (URMS) from a net residual error. The TMU provides an objective and more accurate representation of whether a measurement system under test has an ability to sense true product variation. The invention also includes a method for determining an uncertainty of the TMU.
    Type: Grant
    Filed: February 22, 2005
    Date of Patent: October 23, 2007
    Assignee: International Business Machines Corporation
    Inventors: Charles N. Archie, G. William Banke, Jr., Matthew J. Sendelbach