Patents by Inventor Gabriel Blaj

Gabriel Blaj has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray diffraction and computed tomography
    Patent number: 8477904
    Abstract: An imaging system combines CT and XRD measurements, both measuring the XRD diffraction and the absorption as a function of energy. A goniometer 2, source 4 and two dimensional detector 10 may be used. Embodiments use relatively soft X-rays in the 5-25 keV range. An integrated mounting unit to mount the sample 8 close to detector 10 is also described.
    Type: Grant
    Filed: December 14, 2010
    Date of Patent: July 2, 2013
    Assignee: PANalytical B.V.
    Inventor: Gabriel Blaj
  • X-RAY DIFFRACTION AND COMPUTED TOMOGRAPHY
    Publication number: 20110200164
    Abstract: An imaging system combines CT and XRD measurements, both measuring the XRD diffraction and the absorption as a function of energy. A goniometer 2, source 4 and two dimensional detector 10 may be used. Embodiments use relatively soft X-rays in the 5-25 keV range. An integrated mounting unit to mount the sample 8 close to detector 10 is also described.
    Type: Application
    Filed: December 14, 2010
    Publication date: August 18, 2011
    Applicant: PANalytical B.V.
    Inventor: Gabriel Blaj