Abstract: A system for determining an absolute carrier-envelope phase (CEP) of ultrashort laser pulses includes a laser system for generating a laser beam including ultrashort optical pulses of a duration of less than 10 fs, an ultrabroadband quarter-wave plate configured to polarize the laser beam, and a gas jet emitting a continuous jet stream into the laser beam. The system includes focusing optics to adjust a focal spot of the laser beam to the gas jet, and a detector arrangement including a beam block and a microchannel plate (MCP) imaging detector, wherein the laser beam is directed to the detector arrangement. The method involves using angular streaking to determine the absolute CEP of both elliptically and linearly polarized light.

Abstract: A source emits a pulse to an object to generate a particle, and an imaging detector produces a light flash at an X/Y hit position of the particle. The detector outputs a waveform arising from the particle. An event-driven camera provides a signal from the detector that includes intensity and time-over-threshold signals related to the light flash, time-of-arrival information of the event, and the X and Y hit position of the particle. A photodiode determines a time origin of the pulse from the source. A timing circuit is coupled to the detector and to the photodiode, and determines time-of-flight (TOF) of the particle based on the waveform, and based on the time origin of the pulse. The 3D coordinates are generated based on the X/Y hit position synchronized with the TOF of the particle.

Abstract: A system for determining an absolute carrier-envelope phase (CEP) of ultrashort laser pulses includes a laser system for generating a laser beam including ultrashort optical pulses of a duration of less than 10 fs, an ultrabroadband quarter-wave plate configured to polarize the laser beam, and a gas jet emitting a continuous jet stream into the laser beam. The system includes focusing optics to adjust a focal spot of the laser beam to the gas jet, and a detector arrangement including a beam block and a microchannel plate (MCP) imaging detector, wherein the laser beam is directed to the detector arrangement. The method involves using angular streaking to determine the absolute CEP of both elliptically and linearly polarized light.