Patents by Inventor Gail Fenwick

Gail Fenwick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7218130
    Abstract: A probe card for production testing of semiconductor imaging die includes a stiffener supported on a bottom side of the probe card. The top of the stiffener is substantially flush with a top surface of the probe card. A light passage through the stiffener features non-reflective surfaces. Surfaces surrounding the light passage are arranged to avoid casting any shadows on the imaging die being tested. The arrangement provides a low profile probe card. A source of light used to illuminate the imaging die through the light passage can be placed close to the imaging device under test, providing few false negatives and more consistent results from wafer to wafer.
    Type: Grant
    Filed: August 25, 2004
    Date of Patent: May 15, 2007
    Assignee: Micron Technology, Inc.
    Inventors: Deborah Miller, Gail Fenwick, Daniel Strittmatter
  • Publication number: 20060043984
    Abstract: A probe card for production testing of semiconductor imaging die includes a stiffener supported on a bottom side of the probe card. The top of the stiffener is substantially flush with a top surface of the probe card. A light passage through the stiffener features non-reflective surfaces. Surfaces surrounding the light passage are arranged to avoid casting any shadows on the imaging die being tested. The arrangement provides a low profile probe card. A source of light used to illuminate the imaging die through the light passage can be placed close to the imaging device under test, providing few false negatives and more consistent results from wafer to wafer.
    Type: Application
    Filed: August 25, 2004
    Publication date: March 2, 2006
    Inventors: Deborah Miller, Gail Fenwick, Daniel Strittmatter