Patents by Inventor Gaku Nakano

Gaku Nakano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11138711
    Abstract: A degradation detection device (10) includes: an image acquisition unit (11) that acquires an image sequence of a detection target; a matching point specification unit (12) that specifies matching points in the image sequence; a motion amount calculation unit (13) that, based on the specified matching points, for each frame that constitutes the image sequence, specifies motion occurring between the frame and a frame immediately previous thereto, and calculates a motion amount for each of the matching points along a time series; and a degraded region candidate specification unit (14) that specifies a region in which degradation has likely occurred in the image sequence, based on the motion amounts of the matching points that were calculated along the time series.
    Type: Grant
    Filed: August 2, 2016
    Date of Patent: October 5, 2021
    Assignee: NEC CORPORATION
    Inventors: Subhajit Chaudhury, Gaku Nakano
  • Publication number: 20210033451
    Abstract: A vibration measurement apparatus 30 includes a detection unit 31 that acquires, as a pattern image from an image capturing apparatus 20 that shoots a measurement target surface of a structure 40, an image of the measurement target surface onto which pattern light is projected by an optical apparatus 10, and detects the pattern light from the pattern image, an estimation unit 32 that estimates an angle between the normal of the image capturing surface and the normal of the measurement target surface, based on the pattern light, an image conversion unit 33 that converts the shot image into an image that would be obtained were the normal of the measurement target surface coincident with the normal of the image capturing surface of the image capturing apparatus 20, using the estimated angle, and a vibration measurement unit 34 that measures the vibration of the structure 40 using the converted image.
    Type: Application
    Filed: March 29, 2018
    Publication date: February 4, 2021
    Applicant: NEC Corporation
    Inventors: Gaku NAKANO, Masahiko OHTA, Asuka ISHII, Kazuhito MURATA
  • Publication number: 20210029297
    Abstract: A vibration measurement system comprises an image capturing apparatus, a distance measuring apparatus, a sensor that outputs a signal according to an inclination of the image capturing apparatus relative to the vertical direction, and a vibration measurement apparatus. The vibration measurement apparatus includes calculating an angle formed by the normal of an image capturing surface of the image capturing apparatus and the normal of the measurement target surface that the image capturing apparatus shoots, based on the signal output by the sensor, converting the image obtained that the image capturing apparatus shoots into an image that would be obtained were the normal of the measurement target surface coincident with the normal of the image capturing surface of the image capturing apparatus, using the calculated angle, and measuring vibration of the structure, using the converted image and the measured distance from the image capturing apparatus to the measurement target surface.
    Type: Application
    Filed: March 29, 2018
    Publication date: January 28, 2021
    Applicant: NEC Corporation
    Inventors: Gaku NAKANO, Kazuhito MURATA, Asuka ISHII, Masahiko OHTA
  • Publication number: 20200393289
    Abstract: A measurement system 100 includes: a measurement apparatus 20 that measures vibrations of an object 40; an imaging apparatus 30 that is fixed to the measurement apparatus 20 so as to be able to capture an image of a preset reference face 50; and a correction processing apparatus 10. The correction processing apparatus 10 includes: a displacement calculation unit 11 that calculates a displacement of the reference face 50 based on time-series images of the reference face 50; a movement amount calculation unit 12 that calculates an amount of movement of the measurement apparatus 30 relative to the reference face 50, based on the displacement and preset imaging information regarding the imaging apparatus 30; and a correction processing unit 13 that corrects vibrations measured by the measurement apparatus 20, so as to be vibrations relative to the reference face 50, using the calculated amount of movement.
    Type: Application
    Filed: November 14, 2017
    Publication date: December 17, 2020
    Applicant: NEC Corporation
    Inventors: Masahiko OHTA, Gaku NAKANO, Kazuhito MURATA
  • Publication number: 20200348168
    Abstract: The measurement system 100 includes: a measurement apparatus 20 that measures vibrations of an object 40; an imaging apparatus 30 that is located so as to capture an image of the measurement apparatus 20; and a correction processing apparatus 10. the correction processing apparatus 10 includes: a displacement calculation unit 11 that calculates a displacement of the measurement apparatus 20 based on time-series images of the measurement apparatus 20 output from the imaging apparatus 30; a movement amount calculation unit 12 that calculates an amount of movement of the measurement apparatus 20 relative to the imaging apparatus 30, based on the displacement; and a correction processing unit 13 that corrects vibrations of the object measured by the measurement apparatus 20, using the calculated amount of movement of the measurement apparatus 20.
    Type: Application
    Filed: November 14, 2017
    Publication date: November 5, 2020
    Applicant: NEC Corporation
    Inventors: Gaku NAKANO, Kazuhito MURATA, Masahiko OHTA
  • Patent number: 10719956
    Abstract: A camera parameter estimation apparatus 10 estimates camera parameters when an object is photographed by a camera. The camera parameter estimation apparatus 10 is provided with: a parameter calculation unit 20 configured to divide an error function representing a transformation between at least six sets of three-dimensional points relating to the object and two-dimensional points on an image that correspond to the respective three-dimensional points into a plurality of subproblems based on dependency among the camera parameters and the flatness of distribution of the three-dimensional points, and to calculate optimal solution candidates in the respective subproblems; and a parameter optimization unit 30 configured, with the optimal solution candidates as initial values, to find an optimal solution for minimizing an error obtained by the error function, and to output the found optimal solution as an optimal camera parameter.
    Type: Grant
    Filed: February 5, 2018
    Date of Patent: July 21, 2020
    Assignee: NEC CORPORATION
    Inventor: Gaku Nakano
  • Publication number: 20200184622
    Abstract: A degradation detection device (10) includes: an image acquisition unit (11) that acquires an image sequence of a detection target; a matching point specification unit (12) that specifies matching points in the image sequence; a motion amount calculation unit (13) that, based on the specified matching points, for each frame that constitutes the image sequence, specifies motion occurring between the frame and a frame immediately previous thereto, and calculates a motion amount for each of the matching points along a time series; and a degraded region candidate specification unit (14) that specifies a region in which degradation has likely occurred in the image sequence, based on the motion amounts of the matching points that were calculated along the time series.
    Type: Application
    Filed: August 2, 2016
    Publication date: June 11, 2020
    Applicant: NEC CORPORATION
    Inventors: Subhajit CHAUDHURY, Gaku NAKANO
  • Publication number: 20200154023
    Abstract: In order to provide a technique for improving precision of location estimation using a video, a location estimation device includes: a video processing unit that executes video processing including location estimation of an imaging unit, based on a plurality of feature points extracted from a video captured by the imaging unit and composed of a plurality of frames; and an imaging control unit that determines, on the basis of video-related information acquired in the video processing on a first frame belonging to a first group out of the plurality of frames, an exposure condition of the imaging unit in a second frame belonging to a second group different from the first group out of the plurality of frames.
    Type: Application
    Filed: July 27, 2017
    Publication date: May 14, 2020
    Applicant: NEC Corporation
    Inventors: Yoshiaki SATO, Noriyoshi HIROI, Gaku NAKANO
  • Publication number: 20200097522
    Abstract: A parameter estimation apparatus 10 is an apparatus for calculating a threshold for separating a plurality of data points into outliers and inliers and estimating a parameter fitting the inliers. The parameter estimation apparatus 10 includes: a parameter estimation unit 13 configured to estimate the parameter by using the plurality of data points as input; a threshold setting unit 14 configured to calculate the threshold based on statistical information of residuals of the data points; and a convergence determination unit 15 configured to determine whether or not convergence of the estimation of the parameter is reached based on the estimated parameter and the calculated threshold, and to cause the parameter estimation unit 13 and the threshold setting unit 14 to each execute processing again if the convergence determination unit 15 determines that convergence is not reached.
    Type: Application
    Filed: April 27, 2017
    Publication date: March 26, 2020
    Applicant: NEC Corporation
    Inventors: Gaku NAKANO, Takashi SHIBATA
  • Publication number: 20200051279
    Abstract: A camera parameter estimation apparatus 10 estimates camera parameters when an object is photographed by a camera. The camera parameter estimation apparatus 10 is provided with: a parameter calculation unit 20 configured to divide an error function representing a transformation between at least six sets of three-dimensional points relating to the object and two-dimensional points on an image that correspond to the respective three-dimensional points into a plurality of subproblems based on dependency among the camera parameters and the flatness of distribution of the three-dimensional points, and to calculate optimal solution candidates in the respective subproblems; and a parameter optimization unit 30 configured, with the optimal solution candidates as initial values, to find an optimal solution for minimizing an error obtained by the error function, and to output the found optimal solution as an optimal camera parameter.
    Type: Application
    Filed: February 5, 2018
    Publication date: February 13, 2020
    Applicant: NEC Corporation
    Inventor: Gaku NAKANO
  • Publication number: 20190178814
    Abstract: A state assessing device 100 includes: a parameter estimation unit 110 that estimates, using time-series images obtained by an image taking device taking images of a structure and a measured value of a distance from the image taking device to the structure, a motion parameter representing a relative motion of a surface of the structure with respect to the image taking device; and an abnormality determination unit 120 that determines an abnormality in the structure by using an estimation result of the motion parameter.
    Type: Application
    Filed: June 21, 2017
    Publication date: June 13, 2019
    Applicant: NEC Corporation
    Inventors: Gaku NAKANO, Subhajit CHAUDHURY
  • Patent number: 10197502
    Abstract: For detecting a crack formed on a structure surface without erroneously, an information processing device that detects a crack on a structure, includes a change detection unit that detects a change in positions of at least two measurement points on the structure; and a crack detection unit that detects a crack based on the change in the positions of the measurement points detected by the change detection unit.
    Type: Grant
    Filed: February 19, 2015
    Date of Patent: February 5, 2019
    Assignee: NEC Corporation
    Inventors: Masahiko Ohta, Jun Takada, Hiroshi Imai, Atsushi Hatabu, Gaku Nakano, Zhen Wang, Yuzo Senda
  • Patent number: 10126115
    Abstract: A triangulation device for computing a three-dimensional position of a measurement target point using a stereo method, the triangulation device includes: optimum image coordinate estimation unit configured to, based on coordinates of corresponding points corresponding to the measurement target point in two images each of which including an image of the measurement target point, and intrinsic parameters and extrinsic parameters of optical instruments generating the two images, calculate correction vectors by which coordinates of the corrected corresponding points satisfy an epipolar equation composed of the intrinsic parameters and the extrinsic parameters, using a characteristic polynomial including a correction amount of coordinates of the corresponding points or a reciprocal of the correction amount as a variable, and compute coordinates of the corrected corresponding points based on calculated correction vectors; and three-dimensional coordinate calculation unit configured to calculate three-dimensional co
    Type: Grant
    Filed: September 18, 2015
    Date of Patent: November 13, 2018
    Assignee: NEC CORPORATION
    Inventor: Gaku Nakano
  • Publication number: 20170254637
    Abstract: A triangulation device for computing a three-dimensional position of a measurement target point using a stereo method, the triangulation device includes: optimum image coordinate estimation unit configured to, based on coordinates of corresponding points corresponding to the measurement target point in two images each of which including an image of the measurement target point, and intrinsic parameters and extrinsic parameters of optical instruments generating the two images, calculate correction vectors by which coordinates of the corrected corresponding points satisfy an epipolar equation composed of the intrinsic parameters and the extrinsic parameters, using a characteristic polynomial including a correction amount of coordinates of the corresponding points or a reciprocal of the correction amount as a variable, and compute coordinates of the corrected corresponding points based on calculated correction vectors; and three-dimensional coordinate calculation unit configured to calculate three-dimensional co
    Type: Application
    Filed: September 18, 2015
    Publication date: September 7, 2017
    Applicant: NEC Corporation
    Inventor: Gaku NAKANO
  • Publication number: 20170038307
    Abstract: For detecting a crack formed on a structure surface without erroneously, an information processing device that detects a crack on a structure, includes a change detection unit that detects a change in positions of at least two measurement points on the structure; and a crack detection unit that detects a crack based on the change in the positions of the measurement points detected by the change detection unit.
    Type: Application
    Filed: February 19, 2015
    Publication date: February 9, 2017
    Inventors: Masahiko OHTA, Jun TAKADA, Hiroshi IMAI, Atsushi HATABU, Gaku NAKANO, Zhen WANG, Yuzo SENDA
  • Patent number: 9491331
    Abstract: The present invention is a spectral image processing method including the steps of selecting observed spectral information from a multispectral image of a scene, generating a constraint on a spectral distribution of an illumination and a constraint on a surface reflectance of an object using a basis vector of the illumination and a basis vector of the surface reflectance, generating an observation equation that takes as parameters a weight coefficient of the basis vector of the illumination and a weight coefficient of the basis vector of the surface reflectance using the observed spectral information, the constraint on the spectral distribution of the illumination, and the constraint on the surface reflectance of the object, and calculating the spectral distribution of the illumination and the surface reflectance of the object of the scene from the observation equation.
    Type: Grant
    Filed: December 13, 2012
    Date of Patent: November 8, 2016
    Assignee: NEC Corporation
    Inventors: Eiji Kaneko, Masato Tsukada, Gaku Nakano
  • Publication number: 20150207959
    Abstract: The present invention is a spectral image processing method including the steps of selecting observed spectral information from a multispectral image of a scene, generating a constraint on a spectral distribution of an illumination and a constraint on a surface reflectance of an object using a basis vector of the illumination and a basis vector of the surface reflectance, generating an observation equation that takes as parameters a weight coefficient of the basis vector of the illumination and a weight coefficient of the basis vector of the surface reflectance using the observed spectral information, the constraint on the spectral distribution of the illumination, and the constraint on the surface reflectance of the object, and calculating the spectral distribution of the illumination and the surface reflectance of the object of the scene from the observation equation.
    Type: Application
    Filed: December 13, 2012
    Publication date: July 23, 2015
    Applicant: NEC CORPORATION
    Inventors: Eiji Kaneko, Masato Tsukada, Gaku Nakano
  • Patent number: 9053522
    Abstract: An image processing device comprises: image display means which displays at least one of transformation target images containing an object of interest; first reference point receiving/determining means which receives information on first reference point candidates according to a user operation, receives according to a user operation a determination signal targeted at the first reference point candidates displayed on the transformation target image based on the information on the first reference point candidates, and determines first reference points based on the information on the first reference point candidates targeted by the received determination signal; second reference point receiving/determining means which determines second reference points by receiving information on the second reference points; and geometric transformation means which outputs a transformed image by conducting geometric transformation to the transformation target image based on the first reference points determined by the first refe
    Type: Grant
    Filed: May 18, 2011
    Date of Patent: June 9, 2015
    Assignee: NEC CORPORATION
    Inventor: Gaku Nakano
  • Publication number: 20130064430
    Abstract: An image processing device comprises: image display means which displays at least one of transformation target images containing an object of interest; first reference point receiving/determining means which receives information on first reference point candidates according to a user operation, receives according to a user operation a determination signal targeted at the first reference point candidates displayed on the transformation target image based on the information on the first reference point candidates, and determines first reference points based on the information on the first reference point candidates targeted by the received determination signal; second reference point receiving/determining means which determines second reference points by receiving information on the second reference points; and geometric transformation means which outputs a transformed image by conducting geometric transformation to the transformation target image based on the first reference points determined by the first refe
    Type: Application
    Filed: May 18, 2011
    Publication date: March 14, 2013
    Applicant: NEC CORPORATION
    Inventor: Gaku Nakano