Patents by Inventor Galen H. Kawamoto
Galen H. Kawamoto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9815276Abstract: A firing circuit for a thermal inkjet-printing nozzle includes a heater resistor and a switch. The heater resistor heats ink to cause the ink to be ejected from the nozzle. The heater resistor has a first end and a second end, the second end connected to a ground. The switch controls activation of the heater resistor. The switch has a first end connected to a voltage source and a second end connected to the first end of the heater resistor. The switch operates in a constant current mode, such that an at least substantially constant current flows through the heater resistor upon activation.Type: GrantFiled: January 29, 2016Date of Patent: November 14, 2017Assignee: Hewlett-Packard Development Company, L.P.Inventors: Hang Liao, Richard R. Clark, Galen H. Kawamoto, Dennis J. Schloeman, Bao Yeh
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Patent number: 9770901Abstract: A firing circuit for a thermal inkjet-printing nozzle includes a heater resistor and a switch. The heater resistor heats ink to cause the ink to be ejected from the nozzle. The heater resistor has a first end and a second end, the second end connected to a ground. The switch controls activation of the heater resistor. The switch has a first end connected to a voltage source and a second end connected to the first end of the heater resistor. The switch operates in a constant current mode, such that an at least substantially constant current flows through the heater resistor upon activation.Type: GrantFiled: January 29, 2016Date of Patent: September 26, 2017Assignee: Hewlett-Packard Development Company, L.P.Inventors: Hang Liao, Richard R. Clark, Galen H. Kawamoto, Dennis J. Schloeman, Bao Yeh
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Publication number: 20160144618Abstract: A firing circuit for a thermal inkjet-printing nozzle includes a heater resistor and a switch. The heater resistor heats ink to cause the ink to be ejected from the nozzle. The heater resistor has a first end and a second end, the second end connected to a ground. The switch controls activation of the heater resistor. The switch has a first end connected to a voltage source and a second end connected to the first end of the heater resistor. The switch operates in a constant current mode, such that an at least substantially constant current flows through the heater resistor upon activation.Type: ApplicationFiled: January 29, 2016Publication date: May 26, 2016Inventors: Hang Liao, Richard R. Clark, Galen H. Kawamoto, Dennis J. Schloeman, Bao Yeh
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Publication number: 20160144619Abstract: A firing circuit for a thermal inkjet-printing nozzle includes a heater resistor and a switch. The heater resistor heats ink to cause the ink to be ejected from the nozzle. The heater resistor has a first end and a second end, the second end connected to a ground. The switch controls activation of the heater resistor. The switch has a first end connected to a voltage source and a second end connected to the first end of the heater resistor. The switch operates in a constant current mode, such that an at least substantially constant current flows through the heater resistor upon activation.Type: ApplicationFiled: January 29, 2016Publication date: May 26, 2016Inventors: Hang Liao, Richard R. Clark, Galen H. Kawamoto, Dennis J. Schloeman, Bao Yeh
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Patent number: 9283750Abstract: A firing circuit for a thermal inkjet-printing nozzle includes a heater resistor and a switch. The heater resistor heats ink to cause the ink to be ejected from the nozzle. The heater resistor has a first end and a second end, the second end connected to a ground. The switch controls activation of the heater resistor. The switch has a first end connected to a voltage source and a second end connected to the first end of the heater resistor. The switch operates in a constant current mode, such that an at least substantially constant current flows through the heater resistor upon activation.Type: GrantFiled: May 20, 2005Date of Patent: March 15, 2016Assignee: Hewlett-Packard Development Company, L.P.Inventors: Hang Liao, Bao Yeh, Galen H. Kawamoto, Dennis J. Schloeman, Richard R. Clark
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Patent number: 8329527Abstract: A nanoscopic transistor is made by forming an oxide layer on a semiconductor substrate, applying resist, patterning the resist using imprint lithography to form a pattern aligned along a first direction, applying a first ion-masking material over the pattern, selectively lifting it off to leave a first ion mask to form a gate, forming doped regions by implanting a suitable dopant, applying another layer of resist and patterning the second resist layer using imprint lithography to form a second pattern aligned along a second direction, applying a second ion-masking material over the second pattern, selectively lifting it off to leave a second ion mask defined by the second pattern, and forming second doped regions in the substrate by implanting a suitable second dopant selectively in accordance with the second ion mask. The method may be used to make an array of nanoscopic transistors.Type: GrantFiled: March 4, 2011Date of Patent: December 11, 2012Assignee: Samsung Electronics Co., Ltd.Inventors: Adam L Ghozeil, James Stasiak, Kevin Peters, Galen H. Kawamoto
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Publication number: 20110159648Abstract: A nanoscopic transistor is made by forming an oxide layer on a semiconductor substrate, applying resist, patterning the resist using imprint lithography to form a pattern aligned along a first direction, applying a first ion-masking material over the pattern, selectively lifting it off to leave a first ion mask to form a gate, forming doped regions by implanting a suitable dopant, applying another layer of resist and patterning the second resist layer using imprint lithography to form a second pattern aligned along a second direction, applying a second ion-masking material over the second pattern, selectively lifting it off to leave a second ion mask defined by the second pattern, and forming second doped regions in the substrate by implanting a suitable second dopant selectively in accordance with the second ion mask. The method may be used to make an array of nanoscopic transistors.Type: ApplicationFiled: March 4, 2011Publication date: June 30, 2011Inventors: Adam L. Ghozeil, James Stasiak, Kevin Peters, Galen H. Kawamoto
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Patent number: 7902015Abstract: A nanoscopic transistor is made by forming an oxide layer on a semiconductor substrate, applying resist, patterning the resist using imprint lithography to form a pattern aligned along a first direction, applying a first ion-masking material over the pattern, selectively lifting it off to leave a first ion mask to form a gate, forming doped regions by implanting a suitable dopant, applying another layer of resist and patterning the second resist layer using imprint lithography to form a second pattern aligned along a second direction, applying a second ion-masking material over the second pattern, selectively lifting it off to leave a second ion mask defined by the second pattern, and forming second doped regions in the substrate by implanting a suitable second dopant selectively in accordance with the second ion mask. The method may be used to make an array of nanoscopic transistors.Type: GrantFiled: May 10, 2005Date of Patent: March 8, 2011Assignee: Samsung Electronics Co., Ltd.Inventors: Adam L Ghozeil, James Stasiak, Kevin Peters, Galen H. Kawamoto
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Patent number: 7727820Abstract: This disclosure relates to misalignment-tolerant processes for fabricating multiplexing/demultiplexing architectures. One process enables fabricating a multiplexing/demultiplexing architecture at a tolerance greater than a pitch of conductive structures with which the architecture is capable of communicating. Another process can enable creation of address elements and conductive structures having substantially identical widths.Type: GrantFiled: April 30, 2004Date of Patent: June 1, 2010Assignee: Hewlett-Packard Development Company, L.P.Inventors: Xiaofeng Yang, Sriram Ramamoorthi, Galen H. Kawamoto
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Patent number: 7683435Abstract: This disclosure relates to misalignment-tolerant multiplexing/demultiplexing architectures. One architecture enables communication with a conductive-structure array having a narrow spacing and pitch. Another architecture can comprise address elements having a width substantially identical to that of conductive-structures with which each of these address elements is capable of communicating. Another architecture can comprise rows of co-parallel address elements oriented obliquely relative to address lines and/or conductive structures.Type: GrantFiled: April 30, 2004Date of Patent: March 23, 2010Assignee: Hewlett-Packard Development Company, L.P.Inventors: Xiaofeng Yang, Sriram Ramamoorthi, Galen H. Kawamoto
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Patent number: 7005335Abstract: A nanoscopic transistor is made by forming an oxide layer on a semiconductor substrate, applying resist, patterning the resist using imprint lithography to form a pattern aligned along a first direction, applying a first ion-masking material over the pattern, selectively lifting it off to leave a first ion mask to form a gate, forming doped regions by implanting a suitable dopant, applying another layer of resist and patterning the second resist layer using imprint lithography to form a second pattern aligned along a second direction, applying a second ion-masking material over the second pattern, selectively lifting it off to leave a second ion mask defined by the second pattern, and forming second doped regions in the substrate by implanting a suitable second dopant selectively in accordance with the second ion mask. The method may be used to make an array of nanoscopic transistors.Type: GrantFiled: July 15, 2003Date of Patent: February 28, 2006Assignee: Hewlett-Packard Development, L.P.Inventors: Adam L Ghozeil, James Stasiak, Kevin Peters, Galen H. Kawamoto
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Patent number: 6512284Abstract: A semiconductor antifuse device that utilizes a resistive heating element as both a heating source or fuse blowing and as part of the fuse link. The antifuse device may also be utilized as a fuse and the antifuse or fuse embodiment can be programmed and read with the same two electrodes. The antifuse or fuse is well suited for use and efficient fabrication in a printhead apparatus or other circuit arrangements.Type: GrantFiled: April 27, 1999Date of Patent: January 28, 2003Assignee: Hewlett-Packard CompanyInventors: Donald W. Schulte, Galen H. Kawamoto, Deepika Sharma
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Publication number: 20020060350Abstract: A semiconductor antifuse device that utilizes a resistive heating element as both a heating source or fuse blowing and as part of the fuse link. The antifuse device may also be utilized as a fuse and the antifuse or fuse embodiment can be programmed and read with the same two electrodes. The antifuse or fuse is well suited for use and efficient fabrication in a printhead apparatus or other circuit arrangements.Type: ApplicationFiled: April 27, 1999Publication date: May 23, 2002Inventors: DONALD W. SCHULTE, GALEN H. KAWAMOTO, DEEPIKA SHARMA
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Patent number: 4917044Abstract: An electrical contact apparatus for use in a plama or glow discharge chamber, particularly a chamber for depositing silicon oxynitride. A feedthrough member provides an electrical path between the interior and exterior of the chamber. An electrical contact member having an outwardly domed surface engages the feedthrough member. A non-conductive collar is disposed about the domed surface for limiting the flow of gas around the domed surface.Type: GrantFiled: June 2, 1989Date of Patent: April 17, 1990Assignee: Intel CorporationInventors: Leopoldo D. Yau, Galen H. Kawamoto
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Patent number: 4837185Abstract: A method of depositing a thin film of silicon oxynitride (Si.sub.x O.sub.y N.sub.z) onto a semiconductor substrate utilizing dual frequency plasma enhanced chemical vapor deposition (PECVD). Plasma formation is achieved by striking gases in a reaction chamber with a high voltage, low frequency radio wave, and then triggering and applying with the leading or trailing edge of the striking pulse, a second high frequency, low power radio wave. The plasma transfers energy into reactant gases forming a thin film of silicon oxynitride (Si.sub.x O.sub.y N.sub.z) onto a semiconductor substrate. The high frequency pulses provides more efficient gas ionization and less pattern, and back oxide sensitivity to film deposition rate.Type: GrantFiled: October 26, 1988Date of Patent: June 6, 1989Assignee: Intel CorporationInventors: Leopoldo D. Yau, Galen H. Kawamoto