Patents by Inventor Ganapathi Krishnan

Ganapathi Krishnan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Materials-based failure analysis in design of electronic devices, and prediction of operating life
    Patent number: 8290753
    Abstract: The technology includes methods, a system, and a computer readable medium for predicting the time to failure of an electronic component, by generating a finite element model of the component, developing a microstructure-based failure model for each representative volume element associated with each node in the finite element model, and calculating a time to failure of the component from the shortest predicted time to failure of any node when a value of a stress variable is applied to the microstructure-based failure model of each node. The technology further includes methods, system, and a medium programmed to predict failure of a system that includes an electronic component, based on predicting time to failure of the component.
    Type: Grant
    Filed: March 13, 2007
    Date of Patent: October 16, 2012
    Assignee: Vextec Corporation
    Inventors: Robert G. Tryon, III, Animesh Dey, Loren A. Nasser, Ganapathi Krishnan
  • Materials-based failure analysis in design of electronic devices
    Patent number: 8285522
    Abstract: The technology includes methods, a system, and a computer readable medium for predicting the failure of an electronic device during design of the device, by receiving data associated with the device, the data including data indicative of a device response to a specific load on the system while the device is in operation, and predicting potential failure of the device using a probabilistic model and the data, wherein the probabilistic model utilizes at least one of fast probability methods and simulation techniques.
    Type: Grant
    Filed: January 24, 2007
    Date of Patent: October 9, 2012
    Assignee: Vextec Corporation
    Inventors: Robert G. Tryon, III, Animesh Dey, Loren A. Nasser, Ganapathi Krishnan
  • Materials-based failure analysis in design of electronic devices, and prediction of operating life
    Publication number: 20080015827
    Abstract: The technology includes for methods, a system, and a computer readable medium for modeling the failure of an electronic component, based on a detailed simulation of fatigue mechanisms in the component. The technology further includes methods, system, and a medium programmed to predict failure of a system that includes an electronic component, based on modeling one or more fatigue mechanisms in the component.
    Type: Application
    Filed: March 13, 2007
    Publication date: January 17, 2008
    Inventors: Robert Tryon, Animesh Dey, Loren Nasser, Ganapathi Krishnan