Patents by Inventor GAPKYOUNG KIM

GAPKYOUNG KIM has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE WITH SAME, AND MEMORY MODULE TESTING METHOD
    Publication number: 20240021261
    Abstract: A memory device includes a memory module and a BIST logic circuit. The BIST logic circuit includes; a pattern generator configured to generate first main data including a first portion, an error correction code (ECC) encoder configured to generate first parity data based on the first main data, and a parity control circuit configured to generate mask data based on the first parity data and the first main data, and generate first substituted parity data based on the mask data and the first parity data, wherein a pattern of the first substituted parity data is the same as a pattern of the first portion of the first main data.
    Type: Application
    Filed: September 27, 2023
    Publication date: January 18, 2024
    Inventors: Eunhye Oh, Jaehyeok Kim, Yong Ki Lee, Gapkyoung Kim, Taewook Park
  • Built-in-self-test logic, memory device with same, and memory module testing method
    Patent number: 11804276
    Abstract: A memory device includes a memory module and a BIST logic circuit. The BIST logic circuit includes; a pattern generator configured to generate first main data including a first portion, an error correction code (ECC) encoder configured to generate first parity data based on the first main data, and a parity control circuit configured to generate mask data based on the first parity data and the first main data, and generate first substituted parity data based on the mask data and the first parity data, wherein a pattern of the first substituted parity data is the same as a pattern of the first portion of the first main data.
    Type: Grant
    Filed: September 7, 2021
    Date of Patent: October 31, 2023
    Inventors: Eunhye Oh, Jaehyeok Kim, Yong Ki Lee, Gapkyoung Kim, Taewook Park
  • BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE WITH SAME, AND MEMORY MODULE TESTING METHOD
    Publication number: 20220293205
    Abstract: A memory device includes a memory module and a BIST logic circuit. The BIST logic circuit includes; a pattern generator configured to generate first main data including a first portion, an error correction code (ECC) encoder configured to generate first parity data based on the first main data, and a parity control circuit configured to generate mask data based on the first parity data and the first main data, and generate first substituted parity data based on the mask data and the first parity data, wherein a pattern of the first substituted parity data is the same as a pattern of the first portion of the first main data.
    Type: Application
    Filed: September 7, 2021
    Publication date: September 15, 2022
    Inventors: EUNHYE OH, JAEHYEOK KIM, YONG KI LEE, GAPKYOUNG KIM, TAEWOOK PARK